{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,10]],"date-time":"2025-05-10T06:26:57Z","timestamp":1746858417881,"version":"3.37.3"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61671340"],"award-info":[{"award-number":["61671340"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2020]]},"DOI":"10.1109\/access.2020.2983433","type":"journal-article","created":{"date-parts":[[2020,3,26]],"date-time":"2020-03-26T19:50:11Z","timestamp":1585252211000},"page":"60626-60636","source":"Crossref","is-referenced-by-count":4,"title":["A Discrete Detection and Decoding of MLC NAND Flash Memory With Retention Noise"],"prefix":"10.1109","volume":"8","author":[{"given":"Wenhao","family":"Sun","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4244-9223","authenticated-orcid":false,"given":"Jianping","family":"Zheng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Introduction to Algorithms","year":"2009","author":"cormen","key":"ref39"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ISIT.2017.8007065"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2010.2046966"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2015.04.003"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ICC.2015.7248335"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2244361"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ISIT.2002.1023752"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.3390\/app8101884"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1007\/BF02985802"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2523759"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2012.2222399"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2714902"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICC.2019.8761436"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSAC.2014.140508"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1962.1057683"},{"journal-title":"Error Control Coding","year":"2001","author":"lin","key":"ref15"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICC.2007.1032"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/SiPS.2015.7345024"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2797694"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICSPCS.2018.8631719"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2160747"},{"article-title":"Refresh SSDS: Enabling high endurance, low cost flash in datacenters","year":"2012","author":"mohan","key":"ref4"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2016.2533498"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2012.6378623"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2280078"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2267753"},{"key":"ref5","first-page":"140","article-title":"Error analysis and retention- aware error management for NAND flash memory","volume":"17","author":"cai","year":"2012","journal-title":"Intel Technol J"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2015.7056062"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/NVMSA.2015.7304359"},{"key":"ref2","first-page":"521","article-title":"Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis","author":"cai","year":"2012","journal-title":"Proc Design Autom Test Eur Conf Exhibition (DATE)"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2013.2295056"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2713127"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1587\/transcom.2018TTI0001"},{"key":"ref22","first-page":"1","article-title":"Overview and investigation of algorithms for the information bottleneck method","author":"hassanpour","year":"2017","journal-title":"Proc 11th Int ITG Conf Syst Commun Coding (SCC)"},{"key":"ref21","first-page":"368","article-title":"The information bottleneck method","author":"tishby","year":"1999","journal-title":"Proc 37th Allerton Conf Commun Comput"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/e15051587"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/564376.564401"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1201\/9781315139470"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ITW.2015.7133169"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8948470\/09047879.pdf?arnumber=9047879","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T01:08:25Z","timestamp":1641949705000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9047879\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/access.2020.2983433","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2020]]}}}