{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,5]],"date-time":"2026-03-05T22:21:20Z","timestamp":1772749280546,"version":"3.50.1"},"reference-count":179,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2020]]},"DOI":"10.1109\/access.2020.2989410","type":"journal-article","created":{"date-parts":[[2020,4,21]],"date-time":"2020-04-21T20:12:20Z","timestamp":1587499940000},"page":"75163-75183","source":"Crossref","is-referenced-by-count":67,"title":["Review of Health Prognostics and Condition Monitoring of Electronic Components"],"prefix":"10.1109","volume":"8","author":[{"given":"Cherry","family":"Bhargava","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pardeep Kumar","family":"Sharma","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohan","family":"Senthilkumar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sanjeevikumar","family":"Padmanaban","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vigna K.","family":"Ramachandaramurthy","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zbigniew","family":"Leonowicz","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Frede","family":"Blaabjerg","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Massimo","family":"Mitolo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref170","first-page":"1","article-title":"Stochastic decision model of the remanufactured product with warranty","volume":"2","author":"kuik","year":"2015","journal-title":"Proc Int Multiconf Eng Comput Sci"},{"key":"ref172","doi-asserted-by":"publisher","DOI":"10.1109\/IRE-PGRQC.1957.5007129"},{"key":"ref171","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2006.02.008"},{"key":"ref174","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/AMR.548.521"},{"key":"ref173","doi-asserted-by":"publisher","DOI":"10.1109\/COMPEL.2019.8769685"},{"key":"ref176","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.07.014"},{"key":"ref175","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2011.2173801"},{"key":"ref178","doi-asserted-by":"publisher","DOI":"10.1504\/IJRS.2008.021064"},{"key":"ref177","author":"klaassen","year":"2006","journal-title":"System Reliability Concepts and Applications"},{"key":"ref168","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2011.590538"},{"key":"ref169","doi-asserted-by":"publisher","DOI":"10.1080\/21681015.2015.1090490"},{"key":"ref39","first-page":"2776","article-title":"Accelerated life test study on thyristors of HVDC converter valve","author":"liu","year":"2019","journal-title":"Proc 9th Int Conf Power Electron ECCE Asia (ICPE-ECCE Asia)"},{"key":"ref38","author":"ogunniyi","year":"2019","journal-title":"Transient simulation of high-voltage silicon carbide super-gate turn-off thyristors (SGTOs) under extreme narrow pulsed conditions"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/IEEM.2015.7385801"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2009.5316414"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2011.07.063"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1051\/e3sconf\/20171611001"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ICPECA47973.2019.8975585"},{"key":"ref36","first-page":"7","article-title":"Monitoring bond wire fatigue based on modeling of IGBT module on-state voltage drop","author":"luo","year":"2019","journal-title":"Proc 8th Renew Power Gener Conf (RPG)"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2973578"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2007.07.051"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2020.2971245"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2839938"},{"key":"ref179","doi-asserted-by":"publisher","DOI":"10.1016\/j.engfailanal.2011.12.004"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2006.870346"},{"key":"ref20","article-title":"Accelerated ageing of aluminum electrolytic capacitor","author":"shukla","year":"0"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/SICE.2006.315063"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1023\/A:1020933909543"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ECTC.2000.853299"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1080\/14686996.2019.1640072"},{"key":"ref101","doi-asserted-by":"publisher","DOI":"10.1016\/S0951-8320(01)00148-X"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.12.004"},{"key":"ref100","doi-asserted-by":"publisher","DOI":"10.1016\/S0377-2217(01)00197-7"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1115\/IMECE2004-62493"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1006\/mssp.1997.0090"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1142\/S0218213003001277"},{"key":"ref154","doi-asserted-by":"publisher","DOI":"10.1243\/09544089JPME220"},{"key":"ref153","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-004-2340-z"},{"key":"ref156","doi-asserted-by":"publisher","DOI":"10.1109\/ICNC.2009.466"},{"key":"ref155","doi-asserted-by":"publisher","DOI":"10.25103\/jestr.021.11"},{"key":"ref150","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2098369"},{"key":"ref152","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2004.837813"},{"key":"ref151","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2169182"},{"key":"ref146","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2004.05.002"},{"key":"ref147","doi-asserted-by":"publisher","DOI":"10.1108\/17410380610688232"},{"key":"ref148","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2007.02.011"},{"key":"ref149","doi-asserted-by":"crossref","first-page":"636","DOI":"10.1109\/TFUZZ.2011.2130527","article-title":"A new prediction model based on belief rule base for system’s behavior prediction","volume":"19","author":"si","year":"2011","journal-title":"IEEE Trans Fuzzy Syst"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/MICAI.2008.38"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCC.2006.875415"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/MED.2007.4433871"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCC.2007.900623"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1784\/insi.2006.48.8.462"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1016\/j.dss.2003.09.003"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2966922"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1006\/mssp.2001.1462"},{"key":"ref40","first-page":"20","article-title":"An intelligent model for residual life prediction of thyristor","volume":"1","author":"bhargava","year":"2020","journal-title":"Life"},{"key":"ref167","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-013-0778-2"},{"key":"ref166","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2677334"},{"key":"ref165","doi-asserted-by":"publisher","DOI":"10.1115\/1.4001207"},{"key":"ref164","doi-asserted-by":"publisher","DOI":"10.1080\/19397030902738952"},{"key":"ref163","doi-asserted-by":"publisher","DOI":"10.1109\/ISEE.2005.1437029"},{"key":"ref162","doi-asserted-by":"publisher","DOI":"10.1080\/07408170490279561"},{"key":"ref161","doi-asserted-by":"publisher","DOI":"10.1117\/12.516226"},{"key":"ref160","doi-asserted-by":"publisher","DOI":"10.1080\/002075400189356"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/63.728347"},{"key":"ref3","article-title":"Electrolytic capacitor cover method and materials for the manufacture thereof","author":"stevens","year":"2002"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.2005.1581687"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/2943.974353"},{"key":"ref159","doi-asserted-by":"publisher","DOI":"10.1016\/S0278-6125(00)87634-7"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/63.261004"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.1997.571735"},{"key":"ref7","year":"2018","journal-title":"Aluminum Electrolytic Capacitors"},{"key":"ref157","first-page":"1938","article-title":"Prediction of profitability of industries using weighted SVR","volume":"3","author":"tomar","year":"2011","journal-title":"Int J Comput Sci Eng"},{"key":"ref158","doi-asserted-by":"publisher","DOI":"10.1016\/j.probengmech.2010.09.008"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IAS.1996.559241"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1081\/QEN-120020775"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.2514\/3.20348"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/ECTC.2006.1645633"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1080\/08982110600846572"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1080\/08982112.2017.1391288"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.2514\/3.21542"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijhydene.2008.10.004"},{"key":"ref43","first-page":"70","article-title":"Reliability and reproducibility of ceramic sensors. I-NTC thermistors","volume":"72","author":"fagan","year":"1993","journal-title":"Amer Ceram Soc Bull"},{"key":"ref127","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2005965"},{"key":"ref126","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmatprotec.2007.07.018"},{"key":"ref125","doi-asserted-by":"publisher","DOI":"10.1080\/00207540412331327727"},{"key":"ref124","doi-asserted-by":"publisher","DOI":"10.1002\/nav.20072"},{"key":"ref73","doi-asserted-by":"publisher","DOI":"10.3390\/jmmp4010026"},{"key":"ref72","doi-asserted-by":"publisher","DOI":"10.1016\/S1568-4946(02)00059-5"},{"key":"ref129","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2009.10.011"},{"key":"ref71","article-title":"Remaining life prediction of electronic products using life consumption monitoring approach","author":"mishra","year":"0"},{"key":"ref128","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2009.08.004"},{"key":"ref70","first-page":"39","article-title":"Competitive supervised learning algorithms in machine condition monitoring","volume":"3","author":"liang","year":"2000","journal-title":"Int J COMADEM"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1109\/ICAL.2007.4338999"},{"key":"ref130","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2009.08.001"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2005.09.015"},{"key":"ref74","first-page":"383","article-title":"A methodology for assessing the remaining life of electronic products","volume":"2","author":"mathew","year":"2006","journal-title":"Int J Performability Eng"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.1016\/j.jom.2007.01.021"},{"key":"ref133","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2004.824875"},{"key":"ref134","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-009-0356-9"},{"key":"ref131","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-009-2509-6"},{"key":"ref78","doi-asserted-by":"publisher","DOI":"10.1504\/IJSM.2008.019224"},{"key":"ref132","doi-asserted-by":"publisher","DOI":"10.3844\/ajassp.2010.390.394"},{"key":"ref79","first-page":"271","article-title":"Adaptive neuro-fuzzy inference system for mid term prognostic error stabilization","volume":"3","author":"dragomir","year":"2008","journal-title":"Proc Int Conf Comput Commun Control (ICCCC)"},{"key":"ref136","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/KEM.450.437"},{"key":"ref135","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2009.11.005"},{"key":"ref138","doi-asserted-by":"publisher","DOI":"10.1080\/10910340701340141"},{"key":"ref137","doi-asserted-by":"crossref","first-page":"467","DOI":"10.1016\/j.ijmachtools.2004.09.007","article-title":"Predictive modeling of surface roughness and tool wear in hard turning using regression and neural networks","volume":"45","author":"karpat","year":"2005","journal-title":"Int J Mach Tools Manuf"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2008.03.003"},{"key":"ref139","doi-asserted-by":"publisher","DOI":"10.1016\/S0951-8320(02)00268-5"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2008.06.009"},{"key":"ref61","author":"halpin","year":"2010","journal-title":"Information Modeling and Relational Databases"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1016\/0951-8320(91)90078-L"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1016\/0026-2714(94)90104-X"},{"key":"ref140","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmachtools.2004.06.004"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1109\/24.387381"},{"key":"ref141","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2006.06.018"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/24.765930"},{"key":"ref142","first-page":"1","article-title":"Mamdani fuzzy inference system modeling to predict surface roughness in laser machining","volume":"2","author":"brevern","year":"2009","journal-title":"Int J Intell Inf Technol Appl"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1016\/S0007-8506(07)63192-8"},{"key":"ref143","first-page":"451","article-title":"Machining quality predictions: Comparative analysis of neural network and fuzzy logic","volume":"9","author":"sivarao","year":"2009","journal-title":"Int J Electr Comput Sci"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1016\/S0029-5493(99)00138-7"},{"key":"ref144","first-page":"1","article-title":"Fuzzy logic system for tractive performance prediction of an intelligent air-cushion track vehicle","volume":"6","author":"hossain","year":"2012","journal-title":"International Journal of Aerospace and Mechanical Engineering"},{"key":"ref2","author":"kuehr","year":"2015","journal-title":"The Global E-waste Monitor"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1007\/s40995-019-00730-4"},{"key":"ref145","doi-asserted-by":"publisher","DOI":"10.1109\/PHM.2012.6228783"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2019.05.023"},{"key":"ref109","doi-asserted-by":"publisher","DOI":"10.1109\/RAECS.2014.6799572"},{"key":"ref95","author":"levitin","year":"2005","journal-title":"The Universal Generating Function in Reliability Analysis and Optimization"},{"key":"ref108","author":"gan","year":"2020","journal-title":"Prognostics and Health Management of Electronics Fundamentals Machine Learning and the Internet of Things"},{"key":"ref94","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2005.09.012"},{"key":"ref107","doi-asserted-by":"publisher","DOI":"10.1504\/EJIE.2010.033332"},{"key":"ref93","doi-asserted-by":"publisher","DOI":"10.1049\/cp:20060838"},{"key":"ref106","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2009.2016429"},{"key":"ref92","author":"moubray","year":"2001","journal-title":"Reliability-Centered Maintenance"},{"key":"ref105","doi-asserted-by":"publisher","DOI":"10.1108\/13552510810877647"},{"key":"ref91","doi-asserted-by":"publisher","DOI":"10.1109\/EUROCON.2011.5929179"},{"key":"ref104","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2006.01.006"},{"key":"ref90","doi-asserted-by":"publisher","DOI":"10.1177\/0954408911399832"},{"key":"ref103","first-page":"83","article-title":"Model for the selection of predictive maintenance techniques","volume":"45","author":"moya","year":"2007","journal-title":"Inf Syst Oper Res"},{"key":"ref102","doi-asserted-by":"publisher","DOI":"10.1016\/S0007-8506(07)60033-X"},{"key":"ref111","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2006.248190"},{"key":"ref112","article-title":"Digital processor module reliability analysis of nuclear power plant","author":"lee","year":"0"},{"key":"ref110","doi-asserted-by":"publisher","DOI":"10.1016\/j.matpr.2020.02.660"},{"key":"ref98","first-page":"127","article-title":"Predicting remaining useful life of an individual unit using proportional hazards model and logistic regression model","author":"liao","year":"2006","journal-title":"Proc Annu Reliability and Maintainability Symp (RAMS)"},{"key":"ref99","doi-asserted-by":"publisher","DOI":"10.1016\/0951-8320(95)00076-3"},{"key":"ref96","doi-asserted-by":"publisher","DOI":"10.1002\/9780470117842"},{"key":"ref97","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2005.05.017"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IAS.1997.628992"},{"key":"ref11","first-page":"4","volume":"9","author":"lauber","year":"1985","journal-title":"Aluminum electrolytic capacitors-reliability expected life and shelf capability"},{"key":"ref12","first-page":"1","author":"parler","year":"2004","journal-title":"Reliability of CDE aluminum electrolytic capacitors"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.2005.1582040"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.2005.1581617"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2004.1572002"},{"key":"ref118","first-page":"1","article-title":"Failure prediction of electrolytic capacitors in switching-mode power converters","author":"liu","year":"2012","journal-title":"Proc IEEE Prognostics Syst Health Manage Conf (PHM-Beijing)"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.2004.1354771"},{"key":"ref82","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2933063"},{"key":"ref117","doi-asserted-by":"publisher","DOI":"10.1108\/IJQRM-12-2014-0201"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1002\/0470869097"},{"key":"ref81","doi-asserted-by":"publisher","DOI":"10.1504\/IJSM.2009.031365"},{"key":"ref18","article-title":"A simple ESR identification methodology for electrolytic capacitors condition monitoring","author":"leite","year":"0"},{"key":"ref84","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2008.05.008"},{"key":"ref119","first-page":"162","article-title":"A system thinking approach for time dependent availability analysis of multi component systems","author":"rao","year":"2010","journal-title":"Proc 2nd Int Conf Rel Saf Hazard-Risk-Based Technol Phys -Failure Methods (ICRESH)"},{"key":"ref19","article-title":"Highly accelerated testing of capacitors for medical applications","author":"ashburn","year":"0"},{"key":"ref83","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2008.12.154"},{"key":"ref114","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1980.5220742"},{"key":"ref113","doi-asserted-by":"publisher","DOI":"10.1007\/s12206-008-0212-4"},{"key":"ref116","first-page":"36","article-title":"Accelerated ageing tests of aluminum electrolytic capacitors for evaluating lifetime prediction models","volume":"53","author":"jano","year":"2012","journal-title":"Acta Technica Napocensis"},{"key":"ref80","doi-asserted-by":"publisher","DOI":"10.1109\/COASE.2009.5234098"},{"key":"ref115","doi-asserted-by":"publisher","DOI":"10.1109\/24.537021"},{"key":"ref120","first-page":"38","article-title":"Physics-of-failure based approach for predicting life and reliability of electronics components","volume":"313","author":"varde","year":"2010","journal-title":"BARC Newslett"},{"key":"ref89","doi-asserted-by":"publisher","DOI":"10.1108\/02656711111150850"},{"key":"ref121","doi-asserted-by":"publisher","DOI":"10.1109\/SED.2019.8798443"},{"key":"ref122","doi-asserted-by":"publisher","DOI":"10.1080\/09537280412331309208"},{"key":"ref123","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2004.1368175"},{"key":"ref85","doi-asserted-by":"publisher","DOI":"10.1504\/IJSM.2010.031618"},{"key":"ref86","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2009.2034947"},{"key":"ref87","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2010.11.018"},{"key":"ref88","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2010.11.018"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8948470\/09075164.pdf?arnumber=9075164","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T19:51:34Z","timestamp":1639770694000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9075164\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"references-count":179,"URL":"https:\/\/doi.org\/10.1109\/access.2020.2989410","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020]]}}}