{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,16]],"date-time":"2026-07-16T05:52:53Z","timestamp":1784181173264,"version":"3.55.0"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Basic Research Program of China","doi-asserted-by":"publisher","award":["2016YFB0900701"],"award-info":[{"award-number":["2016YFB0900701"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2020]]},"DOI":"10.1109\/access.2020.2990759","type":"journal-article","created":{"date-parts":[[2020,4,27]],"date-time":"2020-04-27T19:57:21Z","timestamp":1588017441000},"page":"85552-85566","source":"Crossref","is-referenced-by-count":11,"title":["Effect of Thickness on the Space Charge Behavior and DC Breakdown Strength of Cross-Linked Polyethylene Insulation"],"prefix":"10.1109","volume":"8","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3039-355X","authenticated-orcid":false,"given":"Zhipeng","family":"Ma","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4407-3773","authenticated-orcid":false,"given":"Lijun","family":"Yang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5176-3129","authenticated-orcid":false,"given":"Muhammad Shoaib","family":"Bhutta","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8117-7075","authenticated-orcid":false,"given":"Haoran","family":"Bian","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4106-8090","authenticated-orcid":false,"given":"Muhammad Zeeshan","family":"Khan","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref38","article-title":"Investigation into charge trapping transport properties and mechanisms in polymeric insulating materials","author":"min","year":"2013"},{"key":"ref33","first-page":"98","article-title":"Effect of voltage waveform and thickness of sample on breakdown voltage strength","author":"wang","year":"1981","journal-title":"Telecommun Eng"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICSD.2013.6619890"},{"key":"ref31","first-page":"510","article-title":"Breakdown behavior of polyethylene at DC voltage stress","author":"riechert","year":"1998","journal-title":"Proc IEEE Int Conf Solid Dielectr (ICSD)"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/14.108152"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1049\/PBED009E_ch17"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2004.1266330"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ICSD.2010.5568211"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/CEIDP.2011.6232762"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CEIDP.2007.4451548"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CEIDP.2017.8257542"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2016.005915"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2017.006178"},{"key":"ref14","year":"2009"},{"key":"ref15","year":"2006"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.21.1639"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.elstat.2010.10.001"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1021\/acs.jpcc.9b00349"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2011.2171372"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICSD.2010.5567885"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.17775\/CSEEJPES.2015.00015"},{"key":"ref27","year":"2016"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.005222"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICD.2018.8468385"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICSD.2010.5568229"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2017.006958"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CEIDP.1999.807885"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2013.6678873"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2017.006200"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/57.318802"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2017.7956629"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/94.919963"},{"key":"ref22","first-page":"16","article-title":"Review of research on space charge in solid dielectrics","volume":"23","author":"zhou","year":"2008","journal-title":"Trans China Electrotechnical Society"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.elstat.2016.12.012"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2018.007282"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/CEIDP.1999.804581"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/4\/5\/202"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2016.006051"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8948470\/09079498.pdf?arnumber=9079498","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T19:51:42Z","timestamp":1639770702000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9079498\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"references-count":38,"URL":"https:\/\/doi.org\/10.1109\/access.2020.2990759","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020]]}}}