{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T20:19:43Z","timestamp":1740169183287,"version":"3.37.3"},"reference-count":42,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2020]]},"DOI":"10.1109\/access.2020.2995948","type":"journal-article","created":{"date-parts":[[2020,5,20]],"date-time":"2020-05-20T20:32:01Z","timestamp":1590006721000},"page":"95618-95628","source":"Crossref","is-referenced-by-count":2,"title":["SEE Fault Sensitivity Analysis and Security Reinforcement Design for FPGA Circuits Based on Complex Network"],"prefix":"10.1109","volume":"8","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1056-6617","authenticated-orcid":false,"given":"Meng-Ru","family":"Wang","sequence":"first","affiliation":[]},{"given":"Tao","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Jin-Bo","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Shan","family":"Zhou","sequence":"additional","affiliation":[]},{"given":"Lu","family":"Kong","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1155\/2019\/1574136"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.physa.2016.08.002"},{"key":"ref33","first-page":"9","article-title":"A method of constructing logical topology in circuits for assessing single event effects based on XDL Netlist","volume":"1","author":"xiang","year":"2017","journal-title":"Space Electronic technology"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.910426"},{"key":"ref31","first-page":"8","article-title":"The analysis on FPGA IP core circuit and its security based on complex network","volume":"10","author":"tingyuan","year":"2017","journal-title":"J Netw Inf Security"},{"article-title":"Research on reliability analysis of power electronic circuits based on complex network theory","year":"2013","author":"yufei","key":"ref30"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.physa.2011.12.030"},{"key":"ref36","first-page":"1","article-title":"Complex network property and reliability analysis of wireless receiver circuit","volume":"31","author":"dingding","year":"2008","journal-title":"Electron Meas Technol"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevE.64.046119"},{"key":"ref34","first-page":"2256","article-title":"Analysis of a small analog electronic circuits based on the complex network","volume":"238","author":"wang","year":"2006","journal-title":"J Harbin Univ Sci Technol"},{"key":"ref10","first-page":"538","article-title":"Challenges of single-particle effect research in new microelectronic technology","volume":"7","author":"guo","year":"2010","journal-title":"Nucl Technol"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1126\/science.286.5439.509"},{"key":"ref11","first-page":"1","article-title":"The influence of single-particle effect on the reliability of satellite space operation","volume":"35","author":"wang","year":"1998","journal-title":"Semicond Inf"},{"article-title":"Modeling and application of circuit fault propagation based on cellular automata","year":"2008","author":"jimei","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ITECHA.2017.8101903"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2004.1329974"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2006.01.007"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2822398"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/WCL.2012.061212.120309"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2264697"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1093\/comnet\/cnv003"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICRSE.2017.8030769"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2812118"},{"key":"ref27","first-page":"51","article-title":"Large scale circuit analysis based on complex networks theory","author":"zhou","year":"2010","journal-title":"Proc Int Conf Comput Mechatronics Control Electron Eng"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DCIS.2015.7388570"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/9781118084328"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.amc.2013.12.083"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1155\/2016\/3498720"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-6993-4"},{"key":"ref7","first-page":"211","article-title":"TID and SEE characterization of Microsemi’s 4th generation radiation tolerant RTG4 flash-based FPGA","author":"rezzak","year":"2015","journal-title":"Proc IEEE Radiat Effects Data Workshop (REDW)"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-7595-9"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2892838"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2015.2431223"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2915508"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPDS.2013.2295793"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CompComm.2017.8322554"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1948.tb01338.x"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2906647"},{"key":"ref41","first-page":"12","author":"guanrong","year":"2015","journal-title":"Introduction to Complex Networks Models Structures and Dynamics"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICTIS.2019.8883746"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2017.2705482"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2018.2865104"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8948470\/09097220.pdf?arnumber=9097220","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T19:52:12Z","timestamp":1639770732000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9097220\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"references-count":42,"URL":"https:\/\/doi.org\/10.1109\/access.2020.2995948","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2020]]}}}