{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,15]],"date-time":"2026-04-15T06:59:52Z","timestamp":1776236392748,"version":"3.50.1"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61674048"],"award-info":[{"award-number":["61674048"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61874156"],"award-info":[{"award-number":["61874156"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61904001"],"award-info":[{"award-number":["61904001"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003995","name":"Anhui Provincial Natural Science Foundation","doi-asserted-by":"publisher","award":["1908085QF272"],"award-info":[{"award-number":["1908085QF272"]}],"id":[{"id":"10.13039\/501100003995","id-type":"DOI","asserted-by":"publisher"}]},{"name":"University Synergy Innovation Program of Anhui Province","award":["GXXT-2019-030"],"award-info":[{"award-number":["GXXT-2019-030"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2020]]},"DOI":"10.1109\/access.2020.3016039","type":"journal-article","created":{"date-parts":[[2020,8,12]],"date-time":"2020-08-12T20:42:42Z","timestamp":1597264962000},"page":"147965-147972","source":"Crossref","is-referenced-by-count":17,"title":["Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm"],"prefix":"10.1109","volume":"8","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7082-4211","authenticated-orcid":false,"given":"Tai","family":"Song","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0307-7236","authenticated-orcid":false,"given":"Huaguo","family":"Liang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6272-8660","authenticated-orcid":false,"given":"Tianming","family":"Ni","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhengfeng","family":"Huang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2621-0933","authenticated-orcid":false,"given":"Yingchun","family":"Lu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jinlei","family":"Wan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0024-987X","authenticated-orcid":false,"given":"Aibin","family":"Yan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584040"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.27"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2019.8758628"},{"key":"ref13","first-page":"1088","article-title":"On static test compaction and test pattern ordering for scan designs","author":"lin","year":"2001","journal-title":"Proc Int Test Conf"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894232"},{"key":"ref15","first-page":"203","article-title":"In search of the optimum test set","author":"daasch","year":"2004","journal-title":"Proc ITC"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2016.7477283"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2018.8383784"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1989.100747"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630096"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ETSYM.2010.5512789"},{"key":"ref3","year":"2015","journal-title":"International Technology Roadmap for Semiconductors (ITRS)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2008.50"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2009.5413132"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763231"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2017.7928926"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2783302"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-DAT.2018.8373239"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529895"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041765"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2193580"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.21236\/ADA637166"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2019.12.008"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8948470\/09165740.pdf?arnumber=9165740","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T19:55:09Z","timestamp":1639770909000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9165740\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/access.2020.3016039","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020]]}}}