{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,19]],"date-time":"2026-01-19T06:08:13Z","timestamp":1768802893262,"version":"3.49.0"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["N180304018"],"award-info":[{"award-number":["N180304018"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012166","name":"National Basic Research Program of China","doi-asserted-by":"publisher","award":["2017YFB1103700"],"award-info":[{"award-number":["2017YFB1103700"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2020]]},"DOI":"10.1109\/access.2020.3016314","type":"journal-article","created":{"date-parts":[[2020,8,13]],"date-time":"2020-08-13T20:32:15Z","timestamp":1597350735000},"page":"149868-149877","source":"Crossref","is-referenced-by-count":24,"title":["An Intelligent Fault Diagnosis for Rolling Bearing Based on Adversarial Semi-Supervised Method"],"prefix":"10.1109","volume":"8","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5892-3391","authenticated-orcid":false,"given":"Yongchao","family":"Zhang","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1390-1348","authenticated-orcid":false,"given":"Zhaohui","family":"Ren","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4829-1404","authenticated-orcid":false,"given":"Shihua","family":"Zhou","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2005.03.007"},{"key":"ref32","article-title":"A closer look at few-shot classification","author":"chen","year":"2019","journal-title":"arXiv 1904 04232"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2019.02.021"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2019.09.030"},{"key":"ref36","first-page":"2579","article-title":"Visualizing data using t-SNE","volume":"9","author":"van der maaten","year":"2008","journal-title":"J Mach Learn Res"},{"key":"ref35","article-title":"Semi-supervised learning of bearing anomaly detection via deep variational autoencoders","author":"zhang","year":"2019","journal-title":"arXiv 1912 01096"},{"key":"ref34","article-title":"MixMatch: A holistic approach to semi-supervised learning","author":"berthelot","year":"2019","journal-title":"arXiv 1905 02249"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2575318"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2017.2728371"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2018.01.005"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2954091"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2017.10.024"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s11265-018-1378-3"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2018.05.021"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2018.12.025"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.107232"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-018-1456-1"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2956613"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.mfglet.2018.09.002"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2017.04.011"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2956332"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2274415"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2019.05.049"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2977116"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2913058"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2010.12.011"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2964117"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2015.10.014"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2018.11.040"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2018.10.109"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2019.01.001"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2017.2657381"},{"key":"ref24","first-page":"4077","article-title":"Prototypical networks for few-shot learning","author":"snell","year":"2017","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00459"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00814"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2019.04.008"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8948470\/09166486.pdf?arnumber=9166486","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T15:56:47Z","timestamp":1642003007000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9166486\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/access.2020.3016314","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020]]}}}