{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,13]],"date-time":"2026-05-13T16:34:27Z","timestamp":1778690067929,"version":"3.51.4"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2017YFB0902800"],"award-info":[{"award-number":["2017YFB0902800"]}]},{"DOI":"10.13039\/501100010880","name":"Science and Technology Project of the State Grid Corporation of China","doi-asserted-by":"publisher","award":["52094017003D"],"award-info":[{"award-number":["52094017003D"]}],"id":[{"id":"10.13039\/501100010880","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2020]]},"DOI":"10.1109\/access.2020.3022639","type":"journal-article","created":{"date-parts":[[2020,9,8]],"date-time":"2020-09-08T19:46:32Z","timestamp":1599594392000},"page":"165099-165110","source":"Crossref","is-referenced-by-count":36,"title":["A Transfer Learning-Based High Impedance Fault Detection Method Under a Cloud-Edge Collaboration Framework"],"prefix":"10.1109","volume":"8","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9157-782X","authenticated-orcid":false,"given":"Yongjie","family":"Zhang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaojun","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4210-955X","authenticated-orcid":false,"given":"Jinghan","family":"He","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0945-9024","authenticated-orcid":false,"given":"Yin","family":"Xu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7221-3668","authenticated-orcid":false,"given":"Fang","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1704-5454","authenticated-orcid":false,"given":"Yiping","family":"Luo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","first-page":"1","article-title":"High impedance fault detection in distribution network using convolutional neural network based on distribution-level PMU data","author":"zhang","year":"2019","journal-title":"Proc 8th Renew Power Gener Conf (RPG)"},{"key":"ref32","author":"goodfellow","year":"2016","journal-title":"Deep Learning"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/72.554195"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2016.07.054"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2016.2642988"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/FOCS.2006.49"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.jksues.2018.12.001"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/iet-stg.2018.0158"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2019.2911529"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2017.0883"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TSUSC.2018.2879960"},{"key":"ref15","article-title":"High impedance fault detection technology","year":"1996"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSAC.2019.2951964"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2019.2926668"},{"key":"ref18","first-page":"3108","article-title":"Architecture of distribution Internet of Things based on widespread sensing software defined technology","volume":"42","author":"lu","year":"2018","journal-title":"Dianwang Jishu\/Power System Technology"},{"key":"ref19","year":"2020","journal-title":"Schneider EcoStruxure Power"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/34.192463"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2884927"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/18.57199"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2017.0211"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2018.0093"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1002\/int.20281"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2937848"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2014.2361207"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2016.0021"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2018.2791986"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2012.2215630"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2016.10.021"},{"key":"ref20","year":"2020","journal-title":"Siemens Mindsphere"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2019.2904244"},{"key":"ref21","year":"2020","journal-title":"GE Predix Platform"},{"key":"ref24","year":"2020","journal-title":"CoAP RFC 7252 Constrained Application Protocol"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.3390\/app9102135"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2017.2720543"},{"key":"ref25","year":"2020","journal-title":"MQTT Version 5 0"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/8948470\/09187881.pdf?arnumber=9187881","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T19:55:46Z","timestamp":1639770946000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9187881\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020]]},"references-count":35,"URL":"https:\/\/doi.org\/10.1109\/access.2020.3022639","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020]]}}}