{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,5]],"date-time":"2026-05-05T15:50:35Z","timestamp":1777996235458,"version":"3.51.4"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51677084"],"award-info":[{"award-number":["51677084"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100019535","name":"Science Fund for Distinguished Young Scholars of Hebei Province","doi-asserted-by":"publisher","award":["E2020202140"],"award-info":[{"award-number":["E2020202140"]}],"id":[{"id":"10.13039\/501100019535","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100018622","name":"Support Program (III) for 100 Outstanding Innovative Talents in Universities of Hebei Province","doi-asserted-by":"publisher","award":["SLRC2019025"],"award-info":[{"award-number":["SLRC2019025"]}],"id":[{"id":"10.13039\/501100018622","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/access.2020.3041004","type":"journal-article","created":{"date-parts":[[2020,11,27]],"date-time":"2020-11-27T20:23:51Z","timestamp":1606508631000},"page":"15178-15187","source":"Crossref","is-referenced-by-count":23,"title":["High Step-Up ZVT Converter Based on Active Switched Coupled Inductors"],"prefix":"10.1109","volume":"13","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9870-373X","authenticated-orcid":false,"given":"Yu","family":"Tang","sequence":"first","affiliation":[{"name":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7371-9970","authenticated-orcid":false,"given":"Haisheng","family":"Tong","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9372-3819","authenticated-orcid":false,"given":"Raheel","family":"Afzal","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"}]},{"given":"Yingjun","family":"Guo","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Hebei University of Science and Technology, Shijiazhuang, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2024100"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2360495"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2016.2532930"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2897871"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2015.2488839"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2803731"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2603782"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2842051"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2791972"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2325052"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2014.0471"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2698368"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2543499"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2692998"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2763153"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2915348"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2022512"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2018.2876725"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2363662"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2480115"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2011.2163375"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2019.2956098"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2011.2169886"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2009.2026364"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2014.2309793"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2019.2944518"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10820123\/09272757.pdf?arnumber=9272757","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,28]],"date-time":"2025-01-28T18:50:17Z","timestamp":1738090217000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9272757\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/access.2020.3041004","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}