{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,9]],"date-time":"2026-05-09T15:45:09Z","timestamp":1778341509359,"version":"3.51.4"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"National Research and Development Program of China","award":["2017YFB1300800"],"award-info":[{"award-number":["2017YFB1300800"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61671172"],"award-info":[{"award-number":["61671172"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/access.2021.3051409","type":"journal-article","created":{"date-parts":[[2021,1,28]],"date-time":"2021-01-28T21:43:40Z","timestamp":1611870220000},"page":"16019-16029","source":"Crossref","is-referenced-by-count":6,"title":["Soft Fault Diagnosis Using URV-LDA Transformed Feature Dictionary"],"prefix":"10.1109","volume":"9","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5115-4929","authenticated-orcid":false,"given":"Cen","family":"Chen","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yun","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5258-2474","authenticated-orcid":false,"given":"Xuerong","family":"Ye","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1026-6024","authenticated-orcid":false,"given":"Guofu","family":"Zhai","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2019.2910991"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2782232"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2812207"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2465299"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2581139"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2273471"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2014.2341620"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2003.10.002"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2575318"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2731945"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cta.2009.0390"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cta.2014.0717"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/5326.971655"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"833","DOI":"10.1109\/61.853027","article-title":"A fuzzy expert system for the integrated fault diagnosis","volume":"15","author":"lee","year":"2000","journal-title":"IEEE Trans Power Del"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.sepro.2011.11.065"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/62.373993"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/43.712102"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2734120"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/CoASE.2014.6899463"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2868430"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2004.4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2842255"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2187246"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2013.2244210"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2421712"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2016.2635111"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2307993"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2417501"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2018.2865413"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2519325"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2006.884112"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/19.893273"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2050356"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2289074"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2009.177"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/12.559802"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.827085"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9312710\/09321337.pdf?arnumber=9321337","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T19:56:11Z","timestamp":1639770971000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9321337\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":37,"URL":"https:\/\/doi.org\/10.1109\/access.2021.3051409","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021]]}}}