{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,14]],"date-time":"2026-03-14T00:02:14Z","timestamp":1773446534657,"version":"3.50.1"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"State Key Laboratory of Advanced Power Transmission Technology Open Fund","award":["SGGR0000WLQT1800779"],"award-info":[{"award-number":["SGGR0000WLQT1800779"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U1766219"],"award-info":[{"award-number":["U1766219"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/access.2021.3057538","type":"journal-article","created":{"date-parts":[[2021,2,8]],"date-time":"2021-02-08T23:32:19Z","timestamp":1612827139000},"page":"87697-87705","source":"Crossref","is-referenced-by-count":5,"title":["On-Line Measurement of Chip Temperature Based on Blocking Leakage Current of the Insulated-Gate Bipolar Transistor Module in the High-Temperature Reverse-Bias Test"],"prefix":"10.1109","volume":"9","author":[{"given":"Jinyuan","family":"Li","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1479-0109","authenticated-orcid":false,"given":"Yunong","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yaosheng","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhongyuan","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8100-0616","authenticated-orcid":false,"given":"Chunsheng","family":"Guo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hao","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/SSD.2016.7473664"},{"key":"ref11","first-page":"1","article-title":"A health monitoring framework for IGBT power modules","author":"eleffendi","year":"2016","journal-title":"Proc 29th Int Conf Integr Power Electron Syst (CIPS)"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2016.7855433"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2481465"},{"key":"ref14","first-page":"3366","article-title":"Junction temperature extraction of high power IGBT module based on turn-off delay time","volume":"35","author":"sun","year":"2015","journal-title":"Proc Chin Soc Elect Eng"},{"key":"ref15","first-page":"73","author":"sze","year":"2008","journal-title":"Physics of Semiconductor Devices"},{"key":"ref16","first-page":"366","author":"khanna","year":"2004","journal-title":"Insulated Gate Bipolar Transistor IGBT Theory and Design"},{"key":"ref17","first-page":"1","article-title":"The theory, practice and application of thermal resistance measurements of IGBT devices","author":"yen","year":"2010","journal-title":"Proc 34th IEEE\/CPMT Int Electron Manuf Technol Symp (IEMT)"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2619620"},{"key":"ref19","first-page":"3125","article-title":"Self-calibration for IGBT junction temperature measurement in power converter","author":"yuan","year":"2016","journal-title":"Proc IEEE 8th Int Power Electron Motion Control Conf (IPEMC-ECCE Asia)"},{"key":"ref4","first-page":"53","article-title":"Phsyics of semiconductor devices","author":"sze","year":"2006","journal-title":"Plastics"},{"key":"ref3","first-page":"755","article-title":"The influence of power dissipation and air environment on thermal resistance of power VDMOS","volume":"36","author":"dong","year":"2013","journal-title":"Chin J Electron Devices"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2014.2312427"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.1427153"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2464714"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2012.03.032"},{"key":"ref2","year":"0"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2749521"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2017.8096975"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-70917-8"},{"key":"ref22","first-page":"1200","article-title":"Research on the test method and results of HTRB","volume":"4","author":"dong","year":"2016","journal-title":"Smart Grid"},{"key":"ref21","first-page":"128","article-title":"Analysis of characteristic and influence of IGBT collector leakage current","volume":"10","author":"wang","year":"2011","journal-title":"Power Electron"},{"key":"ref24","year":"1993"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(99)00163-8"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9312710\/09348901.pdf?arnumber=9348901","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T19:56:42Z","timestamp":1639771002000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9348901\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/access.2021.3057538","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021]]}}}