{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,11]],"date-time":"2025-11-11T13:40:42Z","timestamp":1762868442669,"version":"3.37.3"},"reference-count":54,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["72001027"],"award-info":[{"award-number":["72001027"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002888","name":"Beijing Municipal Commission of Education","doi-asserted-by":"publisher","award":["KM202111232007"],"award-info":[{"award-number":["KM202111232007"]}],"id":[{"id":"10.13039\/501100002888","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/access.2021.3064296","type":"journal-article","created":{"date-parts":[[2021,3,8]],"date-time":"2021-03-08T21:29:49Z","timestamp":1615238989000},"page":"38649-38659","source":"Crossref","is-referenced-by-count":14,"title":["Simulated Software Testing Process and Its Optimization Considering Heterogeneous Debuggers and Release Time"],"prefix":"10.1109","volume":"9","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9711-3084","authenticated-orcid":false,"given":"Kaiye","family":"Gao","sequence":"first","affiliation":[{"name":"School of Economics and Management, Beijing Information Science & Technology University, Beijing, China"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.01.004"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/S0377-2217(02)00181-9"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2010.02.006"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/24.799900"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/32.148475"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2006.04.007"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.mcm.2011.07.033"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2005.86"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/52.506464"},{"journal-title":"Handbook of Software Reliability Engineering","year":"1996","author":"lyu","key":"ref34"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.2307\/3213524"},{"key":"ref27","first-page":"123","article-title":"On the role of weibull-type distribu-tions in NHPP-based software reliability modeling","volume":"9","author":"xiao","year":"2013","journal-title":"Int J Perform Eng"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/0026-2714(81)90059-7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2017.2671865"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2917403"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1587\/transfun.E95.A.894"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.2014.27"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2009.2019669"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2017.06.034"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2016.05.003"},{"key":"ref26","first-page":"43","article-title":"Early prediction of software fault-prone module using artificial neural network","volume":"11","author":"bisi","year":"2015","journal-title":"Int J Perform Eng"},{"key":"ref25","first-page":"369","article-title":"M-SRAT: Metrics-based software reliability assessment tool","volume":"11","author":"shibata","year":"2015","journal-title":"Int J Perform Eng"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1080\/24725854.2020.1785647"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1016\/j.cja.2017.08.020"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2020.106491"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2017.09.020"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1177\/1748006X19898294"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/app7100983"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2019.2946195"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.3390\/app8050714"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2019.02.023"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2019.106556"},{"key":"ref14","first-page":"50","article-title":"Redundancy versus protection for a non-reparable phased-mission system subject to external impacts","volume":"235","author":"yi","year":"2021","journal-title":"J Risk Reliab"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1002\/qre.827"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2007.909760"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-13-1162-8"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.cl.2017.12.002"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2016.01.025"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2996951"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2527791"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3022087"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3024671"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2012.12.018"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2020.106996"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2018.12.008"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/1-84628-295-0"},{"key":"ref46","first-page":"1","article-title":"Exponential distribution","volume":"2","author":"klein","year":"1996","journal-title":"A Primer Stat Distrib"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1002\/nav.3800260304"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2018.2791425"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1111\/1467-842X.00072"},{"key":"ref42","first-page":"230","article-title":"A logarithmic Poisson execution time model for software reliability measurement","author":"musa","year":"1948","journal-title":"Proc Int Conf Softw Eng"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.3390\/app7121304"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1080\/01621459.1996.10476944"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1979.5220566"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9312710\/09371689.pdf?arnumber=9371689","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,9,8]],"date-time":"2022-09-08T20:46:24Z","timestamp":1662669984000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9371689\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":54,"URL":"https:\/\/doi.org\/10.1109\/access.2021.3064296","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2021]]}}}