{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,20]],"date-time":"2026-02-20T18:31:29Z","timestamp":1771612289700,"version":"3.50.1"},"reference-count":51,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["NSF-1544678"],"award-info":[{"award-number":["NSF-1544678"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000161","name":"National Institute of Standards and Technology","doi-asserted-by":"publisher","award":["70NANB19H090"],"award-info":[{"award-number":["70NANB19H090"]}],"id":[{"id":"10.13039\/100000161","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/access.2021.3065971","type":"journal-article","created":{"date-parts":[[2021,3,15]],"date-time":"2021-03-15T20:16:51Z","timestamp":1615839411000},"page":"44247-44265","source":"Crossref","is-referenced-by-count":74,"title":["A Methodology to Develop and Implement Digital Twin Solutions for Manufacturing Systems"],"prefix":"10.1109","volume":"9","author":[{"given":"Yassine","family":"Qamsane","sequence":"first","affiliation":[]},{"given":"James","family":"Moyne","sequence":"additional","affiliation":[]},{"given":"Maxwell","family":"Toothman","sequence":"additional","affiliation":[]},{"given":"Ilya","family":"Kovalenko","sequence":"additional","affiliation":[]},{"given":"Efe C.","family":"Balta","sequence":"additional","affiliation":[]},{"given":"John","family":"Faris","sequence":"additional","affiliation":[]},{"given":"Dawn M.","family":"Tilbury","sequence":"additional","affiliation":[]},{"given":"Kira","family":"Barton","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","first-page":"1","article-title":"Bringing subject matter expertise and analytics together in solutions for microelectronics smart manufacturing: Consensus, domains, and approaches","author":"moyne","year":"2019","journal-title":"Proc 31st Adv Process Conf (APC)"},{"key":"ref38","article-title":"Method and apparatus for optimizing profit in predictive systems","author":"moyne","year":"2017"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/CTS.2014.6867550"},{"key":"ref32","year":"2005","journal-title":"Common Automation Device Profile Guideline"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-9254-2"},{"key":"ref30","first-page":"26","article-title":"Waterfall vs. V-Model vs. Agile: A comparative study on SDLC","volume":"2","author":"balaji","year":"2012","journal-title":"Int J Inf Technol Bus Manag"},{"key":"ref37","author":"kadre","year":"2015","journal-title":"Practical Business Analytics Using SAS A Hands-on Guidele"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1080\/17517575.2019.1633689"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2020.3040789"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2938885"},{"key":"ref28","year":"2017","journal-title":"About the Unified Modeling Language Specification Version 2 5"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2019.101881"},{"key":"ref29","author":"dennis","year":"2015","journal-title":"Systems analysis and design An object-oriented approach with UML"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/pr5030039"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s12599-014-0334-4"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2998358"},{"key":"ref22","year":"2020","journal-title":"Automation Systems and Integration–Digital Twin Framework for Manufacturing"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-019-01512-w"},{"key":"ref24","year":"2018","journal-title":"Details of the asset administration shell Part 1–The exchange of information between partners in the value chain of industrie 4 0 (version 1 0)"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.mfglet.2020.04.004"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2019.2893397"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/3365871.3365873"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1016\/S0262-1762(17)30139-6"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1016\/j.simpat.2016.11.005"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/B978-1-59749-995-8.00005-3"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IEEESTD.2017.8016712"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2007.91"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1201\/9780429465000"},{"key":"ref13","article-title":"Gartner top 10 strategic technology trends for 2020–smarter with gartner","author":"cearley","year":"2019","journal-title":"Gartner"},{"key":"ref14","author":"marr","year":"2019","journal-title":"The 5 Biggest Technology Trends Disrupting Engineering and Design in 2020"},{"key":"ref15","first-page":"1818","article-title":"The digital twin paradigm for future NASA and US Air Force vehicles","author":"glaessgen","year":"2012","journal-title":"Proc Collection Tech Papers-AIAA\/ASME\/ASCE\/AHS\/ASC Struct Struct Dyn Mater Conf"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2018.1471243"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2019.101895"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2020.101974"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirpj.2020.02.002"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-38756-7_4"},{"key":"ref3","first-page":"1","author":"parrott","year":"2017","journal-title":"Industry 4 0 and the digital twin"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2019.10.001"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"3563","DOI":"10.1007\/s00170-017-0233-1","article-title":"Digital twin-driven product design, manufacturing and service with big data","volume":"94","author":"tao","year":"2018","journal-title":"Int J Adv Manuf Technol"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3000437"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/COASE.2019.8843269"},{"key":"ref49","author":"lei","year":"2016","journal-title":"Intelligent Fault Diagnosis and Remaining Useful Life Prediction of Rotating Machinery"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1057\/9780230510296_4"},{"key":"ref46","article-title":"Bearing data set","author":"lee","year":"2007"},{"key":"ref45","article-title":"Safely entering the deep: A review of verification and validation for machine learning and a challenge elicitation in the automotive industry","author":"borg","year":"2018","journal-title":"arXiv 1812 05389"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2018.1552032"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2005.03.007"},{"key":"ref42","year":"2018","journal-title":"Cyber-Physical Systems - a concept map"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ASMC.2015.7164425"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-57685-5"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2017.1333648"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/6287639\/9312710\/9378543-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9312710\/09378543.pdf?arnumber=9378543","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,8]],"date-time":"2022-04-08T18:53:39Z","timestamp":1649444019000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9378543\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":51,"URL":"https:\/\/doi.org\/10.1109\/access.2021.3065971","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021]]}}}