{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,17]],"date-time":"2026-07-17T15:21:37Z","timestamp":1784301697343,"version":"3.55.0"},"reference-count":47,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"Reliable Power Electronics-Based Power System (REPEPS) Project at the Department of Energy Technology, Aalborg University"},{"name":"Villum Foundation through the Villum Investigator Program"},{"DOI":"10.13039\/501100003968","name":"Iran National Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003968","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/access.2021.3075974","type":"journal-article","created":{"date-parts":[[2021,4,27]],"date-time":"2021-04-27T20:21:15Z","timestamp":1619554875000},"page":"67096-67108","source":"Crossref","is-referenced-by-count":14,"title":["Reliability Modeling of Multistate Degraded Power Electronic Converters With Simultaneous Exposure to Dependent Competing Failure Processes"],"prefix":"10.1109","volume":"9","author":[{"given":"Vahid","family":"Samavatian","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5507-9938","authenticated-orcid":false,"given":"Mahmud","family":"Fotuhi-Firuzabad","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2237-4284","authenticated-orcid":false,"given":"Payman","family":"Dehghanian","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8311-7412","authenticated-orcid":false,"given":"Frede","family":"Blaabjerg","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","article-title":"A systematic approach to reliability assessment of DC-DC power electronic converters","author":"samavatian","year":"2019"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2973312"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2354874"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1177\/1748006X15584263"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2014.09.024"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2014.955152"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2951815"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2017.05.004"},{"key":"ref35","author":"o\u2019connor","year":"2012","journal-title":"Practical Reliability Engineering"},{"key":"ref34","volume":"396","author":"rausand","year":"2004","journal-title":"System reliability theory Models statistical methods and applications"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2769161"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2753722"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2798585"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA.2018.8452547"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2014.2313017"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s11664-018-6600-3"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2018.2838148"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.23919\/EPE17ECCEEurope.2017.8099235"},{"key":"ref17","first-page":"1","article-title":"In-situ condition monitoring system to study the ageing of power semi-conductor devices in photovoltaic inverters","author":"dbeiss","year":"2018","journal-title":"Proc 10th Int Conf Integr Power Electron Syst (CIPS)"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2839625"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2012.2226462"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2018.02.017"},{"key":"ref4","first-page":"405","article-title":"Classification of shock models in system reliability","volume":"27","author":"mallor","year":"2003","journal-title":"Monograf?as del Semin Matem Garc?a de Galdeano"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2017.09.021"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2690500"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2602323"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2016.10.006"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2860587"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2019.2940058"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2005.857509"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2665697"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2018.06.022"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2907218"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2019.106603"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICEPT.2016.7583209"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/ICRMS.2011.5979271"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2018.07.018"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1177\/1464420718780525"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2933063"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1002\/pts.2176"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2010.491502"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2016.7855216"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2019.106641"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2018.2838148"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2299693"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1007\/s10010-010-0119-y"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.09.004"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9312710\/09416647.pdf?arnumber=9416647","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T19:55:50Z","timestamp":1639770950000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9416647\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":47,"URL":"https:\/\/doi.org\/10.1109\/access.2021.3075974","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021]]}}}