{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T20:21:17Z","timestamp":1740169277693,"version":"3.37.3"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/access.2021.3076202","type":"journal-article","created":{"date-parts":[[2021,4,28]],"date-time":"2021-04-28T20:05:49Z","timestamp":1619640349000},"page":"65340-65345","source":"Crossref","is-referenced-by-count":0,"title":["Statistical Strategies to Capture Correlation Between Overshooting Effect and Propagation Delay Time in Nano-CMOS Inverters"],"prefix":"10.1109","volume":"9","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8804-0239","authenticated-orcid":false,"given":"Hamed","family":"Jooypa","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6645-1344","authenticated-orcid":false,"given":"Daryoosh","family":"Dideban","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8412-8164","authenticated-orcid":false,"given":"Hadi","family":"Heidari","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.813457"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDER.2006.307735"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.852164"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-15766-0_87"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2016.03.010"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2018.06.013"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2833879"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s10825-017-1108-2"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2895364"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2035539"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2008.10.002"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2088409"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2364736"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"8879","DOI":"10.1166\/jctn.2016.6057","article-title":"Improved statistical static timing analysis using refactored timing graphs","volume":"13","author":"ramesh","year":"2016","journal-title":"J Comput Theor Nanosci"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.44"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2013.2287179"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2687059"},{"article-title":"Transistor-level statistical timing analysis: Solving random differential equations directly","year":"2013","author":"tang","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/16.915703"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ELTECH.2019.8839501"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5457123"},{"journal-title":"Originlab is a Licensed Software Which Can be Accessed From","year":"2021","key":"ref21"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9312710\/09417181.pdf?arnumber=9417181","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T19:55:51Z","timestamp":1639770951000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9417181\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/access.2021.3076202","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2021]]}}}