{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,15]],"date-time":"2026-04-15T18:30:18Z","timestamp":1776277818769,"version":"3.50.1"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100004663","name":"Ministry of Science and Technology of Taiwan","doi-asserted-by":"publisher","award":["MOST108-2221-E-011-080-MY3"],"award-info":[{"award-number":["MOST108-2221-E-011-080-MY3"]}],"id":[{"id":"10.13039\/501100004663","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/access.2021.3077871","type":"journal-article","created":{"date-parts":[[2021,5,6]],"date-time":"2021-05-06T19:50:40Z","timestamp":1620330640000},"page":"71535-71552","source":"Crossref","is-referenced-by-count":36,"title":["Wavelet-Analysis-Based Singular-Value-Decomposition Algorithm for Weak Arc Fault Detection via Current Amplitude Normalization"],"prefix":"10.1109","volume":"9","author":[{"given":"Yu-Long","family":"Shen","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5483-7445","authenticated-orcid":false,"given":"Rong-Jong","family":"Wai","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2939565"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2489759"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3027002"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2017.2721903"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2922926"},{"key":"ref35","first-page":"106","article-title":"Multi-variable method for arc-fault diagnosis based on EMD and PNN","volume":"39","author":"su","year":"2019","journal-title":"Electr Power Autom Equip"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2016.10.008"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2003.823184"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.4316\/aece.2010.03019"},{"key":"ref12","article-title":"Arc flash detection system, apparatus and method","author":"roscoe","year":"2017"},{"key":"ref13","first-page":"253","article-title":"Study on electric arc’s on-line detection and warning system for low voltage distribution box","author":"aihua","year":"2010","journal-title":"Proc 2nd Int Conf Adv Comput Control"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2927635"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.4271\/2008-01-2870"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2010.2041373"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2014.6860896"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2016.2518738"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2963500"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2960512"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2016.0968"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2014.2361207"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2015.2407868"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2015.08.005"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2011.01.022"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2125939"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2886751"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2864446"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2018.2874879"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2013.2260184"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2017.06.036"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2938979"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/INCAE.2018.8579416"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3027869"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2018.5679"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2273292"},{"key":"ref26","first-page":"10","article-title":"Series arc fault diagnostic method based on fractal dimension and support vector machine","volume":"31","author":"yang","year":"2016","journal-title":"Trans China Electrotech Soc"},{"key":"ref25","first-page":"141","article-title":"Traveling wave fault location based on wavelet and improved singular value difference spectrum","author":"yao","year":"2017","journal-title":"Proc Int Conf Circuits Devices Syst (ICCDS)"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9312710\/09424578.pdf?arnumber=9424578","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T19:55:59Z","timestamp":1639770959000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9424578\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/access.2021.3077871","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021]]}}}