{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,7]],"date-time":"2025-10-07T11:47:04Z","timestamp":1759837624287,"version":"3.37.3"},"reference-count":62,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"Institute of Oceanic Engineering Research, University of Malaga, Malaga, Spain"},{"name":"\u201cCampus de Excelencia Internacional AndaluciaTech,\u201d University of Malaga, Malaga, Spain"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/access.2021.3084545","type":"journal-article","created":{"date-parts":[[2021,5,28]],"date-time":"2021-05-28T19:58:28Z","timestamp":1622231908000},"page":"80582-80602","source":"Crossref","is-referenced-by-count":6,"title":["A Novel Process to Setup Electronic Products Test Sites Based on Figure of Merit and Machine Learning"],"prefix":"10.1109","volume":"9","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8735-7090","authenticated-orcid":false,"given":"Atif","family":"Siddiqui","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4181-5997","authenticated-orcid":false,"given":"Muhammad Yousuf Irfan","family":"Zia","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3042-4392","authenticated-orcid":false,"given":"Pablo","family":"Otero","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/RTEICT.2017.8256589"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/INCEMIC.2016.7921524"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/SIITME.2018.8599232"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICCSP.2014.6949965"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2017.8080486"},{"key":"ref30","first-page":"547","article-title":"A portable measurement system for antenna’s radiation pattern","author":"hamzah","year":"2017","journal-title":"Proc Asia-Pacific Microw Conf (APMC)"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ICEECCOT.2017.8284638"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/RTEICT.2016.7807810"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ELEKTRO.2012.6225613"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ICNISC.2016.050"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2008.2006863"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1109\/WCICA.2008.4593930"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2018.8351578"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/RPC.2018.8482158"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ET.2016.7753471"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMI.2013.6743026"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/RTEICT.2017.8256609"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2015.7356501"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICSGRC.2018.8657606"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ITNEC.2017.8284973"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ITCE.2019.8646602"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/GCCE.2018.8574627"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/METROI4.2018.8428326"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2016.7477283"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.5937\/telfor1702098C"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.3390\/electronics9122016"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.3390\/electronics9030501"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/SCEECS.2012.6184770"},{"key":"ref58","first-page":"333","article-title":"The ‘voice of customer’ Web application at state-owned telecommunication company","author":"atmojo","year":"2018","journal-title":"Proc Int Conf Inf Manage Technol (ICIMTech)"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2870203"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2805680"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1007\/s10462-018-09677-1"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/MLDS.2017.11"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/IISA.2017.8316459"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2020.106773"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/RTEICT42901.2018.9012443"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s11277-020-07203-7"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2018.8532508"},{"journal-title":"Engineer Ambitiously—NI","year":"2021","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.petrol.2018.02.031"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2016.7589601"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2004.12.007"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.4922913"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICPEICES.2016.7853547"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2015.07.007"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2013.6645035"},{"key":"ref4","first-page":"1","article-title":"Design for testability (DFT) to overcome functional board test complexities in manufacturing test","author":"ungar","year":"2017","journal-title":"Proc IPC Apex"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CAC.2018.8623759"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICHVEPS.2017.8225936"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/APEDE.2014.6958285"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/s18020532"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICIMECE.2016.7910419"},{"journal-title":"Welcome to Python","year":"2021","key":"ref49"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MEMSTECH.2018.8365717"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/ICCC.2013.6731691"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/ICACDOT.2016.7877705"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.3390\/electronics9081192"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2019.07.033"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/ICICCT.2018.8472990"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ARFTG.2013.6579052"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ECICE47484.2019.8942754"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2019.8781435"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9312710\/09443195.pdf?arnumber=9443195","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T19:56:20Z","timestamp":1639770980000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9443195\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":62,"URL":"https:\/\/doi.org\/10.1109\/access.2021.3084545","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2021]]}}}