{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,7]],"date-time":"2026-04-07T16:11:16Z","timestamp":1775578276716,"version":"3.50.1"},"reference-count":11,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/access.2021.3092005","type":"journal-article","created":{"date-parts":[[2021,6,24]],"date-time":"2021-06-24T19:45:31Z","timestamp":1624563931000},"page":"92568-92577","source":"Crossref","is-referenced-by-count":3,"title":["Cryptanalysis of Start Code-Based Encryption Method for HEVC"],"prefix":"10.1109","volume":"9","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6378-2407","authenticated-orcid":false,"given":"Min Ku","family":"Lee","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5312-7078","authenticated-orcid":false,"given":"Euee Seon","family":"Jang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3036023"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2005.854469"},{"key":"ref10","year":"2020","journal-title":"PotPlayer"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/AINA.2006.339"},{"key":"ref11","year":"2018"},{"key":"ref5","first-page":"226","article-title":"Is MPEG encryption by using random list instead of zigzag order secure?","author":"qiao","year":"1997","journal-title":"Proc IEEE Int Symp Consum Electron"},{"key":"ref8","year":"2016"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2006.884012"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/11552055_9"},{"key":"ref9","year":"2020","journal-title":"HEVC Test Model (HM)"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/244130.244209"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9312710\/09464309.pdf?arnumber=9464309","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T19:56:45Z","timestamp":1639771005000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9464309\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/access.2021.3092005","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021]]}}}