{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,11]],"date-time":"2026-07-11T17:17:22Z","timestamp":1783790242490,"version":"3.55.0"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100004681","name":"Higher Education Commission Pakistan","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004681","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002701","name":"Ministry of Education","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002701","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/access.2021.3094741","type":"journal-article","created":{"date-parts":[[2021,7,5]],"date-time":"2021-07-05T19:49:23Z","timestamp":1625514563000},"page":"96700-96710","source":"Crossref","is-referenced-by-count":19,"title":["Test Architecture for Systolic Array of Edge-Based AI Accelerator"],"prefix":"10.1109","volume":"9","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5336-7496","authenticated-orcid":false,"given":"Umair Saeed","family":"Solangi","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4063-9525","authenticated-orcid":false,"given":"Muhammad","family":"Ibtesam","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4675-5535","authenticated-orcid":false,"given":"Muhammad Adil","family":"Ansari","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5663-3307","authenticated-orcid":false,"given":"Jinuk","family":"Kim","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2322-232X","authenticated-orcid":false,"given":"Sungju","family":"Park","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref33","article-title":"Rotating data for neural network computations","author":"ross","year":"2015"},{"key":"ref32","article-title":"Prefetching weights for use in a neural network processor","author":"ross","year":"2015"},{"key":"ref31","article-title":"Computing convolutions using a neural network processor","author":"ross","year":"2015"},{"key":"ref30","article-title":"Neural network processor","author":"ross","year":"2015"},{"key":"ref34","author":"singhal","year":"2019","journal-title":"AI chip DFT techniques for aggressive time-to-market"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2019.2910232"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2541940.2541967"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ASAP.2009.25"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/1815961.1815993"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/2742060.2743766"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2018.8368656"},{"key":"ref16","first-page":"1","article-title":"C-testing of AI accelerators*","author":"chaudhuri","year":"2020","journal-title":"Proceedings 9th IEEE Asian Test Symp (ATS)"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/FOCS.1967.33"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1973.223651"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1976.5009199"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ITC-Asia.2019.00024"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2982411"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ISOCC.2018.8649896"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2761740"},{"key":"ref6","year":"2019","journal-title":"High Performance AI at the Edge - NVIDIA Jetson TX2"},{"key":"ref29","first-page":"1","article-title":"Functional criticality classification of structural faults in AI accelerators","author":"chaudhuri","year":"2020","journal-title":"Proc IEEE Int Test Conf (ITC)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2019.2921977"},{"key":"ref8","article-title":"Accelerated Mathematical Engine","author":"bannon","year":"2017"},{"key":"ref7","year":"2019","journal-title":"Edge TPU—Run Inference at Edge"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.future.2019.02.050"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3079856.3080246"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2016.2579198"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1986.1270228"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.1985.5468108"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/0167-9260(89)90020-5"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/12.795222"},{"key":"ref23","doi-asserted-by":"crossref","first-page":"146","DOI":"10.1109\/92.365462","article-title":"C-testable design techniques for iterative logic arrays","volume":"3","author":"lu","year":"1995","journal-title":"IEEE Trans Very Large Scale Integr (VLSI) Syst"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2341674"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355560"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9312710\/09474346.pdf?arnumber=9474346","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,27]],"date-time":"2022-01-27T11:46:02Z","timestamp":1643283962000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9474346\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/access.2021.3094741","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021]]}}}