{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,8]],"date-time":"2025-10-08T22:39:00Z","timestamp":1759963140820,"version":"3.37.3"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51777166"],"award-info":[{"award-number":["51777166"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/access.2021.3096329","type":"journal-article","created":{"date-parts":[[2021,7,12]],"date-time":"2021-07-12T20:34:53Z","timestamp":1626122093000},"page":"101959-101971","source":"Crossref","is-referenced-by-count":6,"title":["An Evaluation Method for Bus and Grid Structure Based on Voltage Sags\/Swells Using Voltage Ellipse Parameters"],"prefix":"10.1109","volume":"9","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9302-900X","authenticated-orcid":false,"given":"Li","family":"Ma","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dingrong","family":"Tian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Taofeng","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shuping","family":"Gao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pengyuan","family":"Dong","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"67","article-title":"Optimal monitor allocation and system sag level assessment based on sag information","volume":"36","author":"lin","year":"2016","journal-title":"Elect Power Automat Equip"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1007\/s40565-016-0183-x"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1016\/j.ijepes.2018.03.016"},{"key":"ref13","first-page":"198","article-title":"Analysis and evaluation of voltage sag severity based on data mining and improved grey target theory","volume":"44","author":"pu","year":"2020","journal-title":"Automat Electr Power Syst"},{"key":"ref14","first-page":"9","article-title":"A system assessment method for voltage sag severity based on average point-to-line distance index","volume":"53","author":"zhong","year":"2020","journal-title":"Electronics& Power"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1049\/iet-gtd.2016.0816"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/TIA.2021.3052156"},{"key":"ref17","first-page":"36","article-title":"Voltage sag vulnerable area identification of a distribution grid with multiple sensitive loads","volume":"48","author":"feng","year":"2020","journal-title":"Power Syst Protection Control"},{"key":"ref18","first-page":"181","article-title":"Influence of grid structure on voltage sag propagation and its quantitative analysis method","volume":"49","author":"hu","year":"2020","journal-title":"Elect Power Automat Equip"},{"key":"ref19","first-page":"1376","article-title":"Estimation of voltage swell frequency caused by asymmetrical faults","volume":"12","author":"park","year":"2017","journal-title":"J Electr Eng Technol"},{"key":"ref28","first-page":"67","author":"zhang","year":"1996","journal-title":"Senior Power Network"},{"key":"ref4","first-page":"74","article-title":"A survey on calculation and analysis methods of voltage sag","volume":"28","author":"li","year":"2004","journal-title":"Power Syst Technol"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1109\/TPWRD.2006.886795"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/TIA.2011.2175885"},{"key":"ref6","first-page":"36","article-title":"Normal cloud model based sensitivity assessment method for sensitive equipment due to voltage sags","volume":"27","author":"li","year":"2011","journal-title":"Power System and Clean Energy"},{"key":"ref5","first-page":"87","article-title":"Voltage sag occurrence frequency assessment caused by line faults using the maximum entropy method","volume":"29","author":"xiao","year":"2009","journal-title":"Proc Chin Soc Electr"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/TIA.2012.2229255"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/ACCESS.2020.3014288"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TIA.2012.2209854"},{"key":"ref9","first-page":"331","article-title":"Voltage sag severity assessment method considering multi-dimension characterization","volume":"45","author":"hu","year":"2021","journal-title":"Power Syst Technol"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TPWRD.2014.2355877"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/TIA.2015.2397176"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/TPWRS.2002.804995"},{"year":"1943","author":"clarke","journal-title":"Circuit Analysis of AC Power Systems","key":"ref21"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1109\/FPS.2005.204283"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1109\/TPWRD.2009.2028787"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1109\/28.293731"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1109\/IECON.2011.6119419"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9312710\/09481134.pdf?arnumber=9481134","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T19:56:59Z","timestamp":1639771019000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9481134\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/access.2021.3096329","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2021]]}}}