{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,12]],"date-time":"2026-02-12T17:27:40Z","timestamp":1770917260364,"version":"3.50.1"},"reference-count":99,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea (NRF) grant funded by the Korean Government","doi-asserted-by":"publisher","award":["2019R1F1A1059346"],"award-info":[{"award-number":["2019R1F1A1059346"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea (NRF) grant funded by the Korean Government","doi-asserted-by":"publisher","award":["2021R1F1A1046416"],"award-info":[{"award-number":["2021R1F1A1046416"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002613","name":"AI Collaboration Project Fund of Ulsan National Institute of Science and Technology","doi-asserted-by":"publisher","award":["1.210095"],"award-info":[{"award-number":["1.210095"]}],"id":[{"id":"10.13039\/501100002613","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/access.2021.3115665","type":"journal-article","created":{"date-parts":[[2021,9,24]],"date-time":"2021-09-24T20:50:05Z","timestamp":1632516605000},"page":"132455-132467","source":"Crossref","is-referenced-by-count":37,"title":["A Multimodal Deep Learning-Based Fault Detection Model for a Plastic Injection Molding Process"],"prefix":"10.1109","volume":"9","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7486-8628","authenticated-orcid":false,"given":"Gyeongho","family":"Kim","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4733-1937","authenticated-orcid":false,"given":"Jae Gyeong","family":"Choi","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3172-1516","authenticated-orcid":false,"given":"Minjoo","family":"Ku","sequence":"additional","affiliation":[]},{"given":"Hyewon","family":"Cho","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9534-7397","authenticated-orcid":false,"given":"Sunghoon","family":"Lim","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2019.2917521"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2017.2676245"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2021.07.001"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2020.10.013"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA.2015.7301557"},{"key":"ref30","doi-asserted-by":"crossref","first-page":"1943","DOI":"10.1007\/s00170-021-07252-7","article-title":"A study of micromanufacturing process fingerprints in micro-injection moulding for machine learning and industry 4.0 applications","author":"g\u00fcl\u00e7\u00fcr","year":"2021","journal-title":"Int J Adv Manuf Technol"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/s10033-017-0189-y"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/S0924-0136(00)00498-2"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/CIVEMSA.2017.7995316"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2007.07.037"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2020.2983061"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2014.2374339"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCC.2004.843228"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.promfg.2018.03.089"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-010-0378-3"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2014.05.003"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2007.907607"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2011.2154850"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2018.2857818"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2010.2065531"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1007\/s10618-019-00619-1"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2993538"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2018.08.003"},{"key":"ref58","doi-asserted-by":"crossref","first-page":"80","DOI":"10.1109\/TSM.2014.2378796","article-title":"Statistical comparison of fault detection models for semiconductor manufacturing processes","volume":"28","author":"lee","year":"2015","journal-title":"IEEE Trans Semicond Manuf"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2011.611538"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/66.983447"},{"key":"ref55","author":"morchen","year":"2003","journal-title":"Time series feature extraction for data mining using dwt and dft"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1007\/s10115-004-0154-9"},{"key":"ref53","first-page":"1","article-title":"Robust fault detection and fault classification of semiconductor manufacturing equipment","volume":"2","author":"ison","year":"1996","journal-title":"Proc Int Symp Semiconductor Manuf"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.21629\/JSEE.2017.01.18"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCC.2004.843228"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/nature14539"},{"key":"ref3","first-page":"750","article-title":"Fault detection methods: A literature survey","author":"miljkovic","year":"2011","journal-title":"Proc 34th Int Conv MIPRO"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.cosrev.2020.100357"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2021.115400"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1177\/1748006X15623089"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.23919\/CCC50068.2020.9188930"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1115\/1.1445155"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1080\/21693277.2016.1192517"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2021.115532"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswax.2019.100007"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/ICDM.2016.0133"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1007\/s10618-016-0483-9"},{"key":"ref42","first-page":"689","article-title":"Multimodal deep learning","author":"ngiam","year":"2011","journal-title":"Proc 28th Int Conf Mach Learn"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.3390\/polym12081812"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.3390\/s19245370"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46723-8_14"},{"key":"ref73","first-page":"2222","article-title":"Multimodal learning with deep Boltzmann machines","author":"srivastava","year":"2012","journal-title":"Proc 25th Int Conf Neural Inf Process Syst"},{"key":"ref72","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-85099-1_8"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2009.12.002"},{"key":"ref70","doi-asserted-by":"publisher","DOI":"10.1007\/s00500-012-0896-3"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46672-9_58"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3023871"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1145\/3161174"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2014.299"},{"key":"ref78","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2991475"},{"key":"ref79","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2017.2738401"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2020.3037085"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2019.8926924"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2940769"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-020-01591-0"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/AICCSA.2018.8612875"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2018.2798607"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2916887"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1002\/ehf2.12929"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1007\/s10044-017-0597-8"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2018.03.087"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2018.2868977"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-019-03988-5"},{"key":"ref95","author":"chollet","year":"2015","journal-title":"Keras"},{"key":"ref94","article-title":"TensorFlow: Large-scale machine learning on heterogeneous distributed systems","author":"abadi","year":"2016","journal-title":"arXiv 1603 04467"},{"key":"ref93","first-page":"281","article-title":"Random search for hyper-parameter optimization","volume":"13","author":"bergstra","year":"2012","journal-title":"J Mach Learn Res"},{"key":"ref92","first-page":"3147","article-title":"LightGBM: A highly efficient gradient boosting decision tree","author":"ke","year":"2017","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref91","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2018.2858826"},{"key":"ref90","article-title":"Layer normalization","author":"lei ba","year":"2016","journal-title":"arXiv 1607 06450"},{"key":"ref98","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2009.191"},{"key":"ref99","first-page":"1","article-title":"A hybrid generalization network for intelligent fault diagnosis of rotating machinery under unseen working conditions","volume":"70","author":"han","year":"2021","journal-title":"IEEE Trans Instrum Meas"},{"key":"ref96","article-title":"Adam: A method for stochastic optimization","author":"kingma","year":"2014","journal-title":"arXiv 1412 6980"},{"key":"ref97","doi-asserted-by":"publisher","DOI":"10.1002\/9781118646106"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.5121656"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2918020"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2913786"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1023\/A:1015730705078"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-019-03699-x"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2015.01.015"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2018.11.017"},{"key":"ref82","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2015.06.008"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-019-01481-0"},{"key":"ref81","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2021.03.083"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-015-8013-2"},{"key":"ref84","doi-asserted-by":"publisher","DOI":"10.3115\/v1\/D14-1179"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2018.1552032"},{"key":"ref83","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-10590-1_53"},{"key":"ref80","article-title":"Learn to combine modalities in multimodal deep learning","author":"liu","year":"2018","journal-title":"arXiv 1805 11730"},{"key":"ref89","article-title":"Batch normalization: Accelerating deep network training by reducing internal covariate shift","author":"ioffe","year":"2015","journal-title":"arXiv 1502 03167"},{"key":"ref85","doi-asserted-by":"publisher","DOI":"10.1162\/neco.1997.9.8.1735"},{"key":"ref86","article-title":"Empirical evaluation of gated recurrent neural networks on sequence modeling","author":"chung","year":"2014","journal-title":"arXiv 1412 3555"},{"key":"ref87","doi-asserted-by":"publisher","DOI":"10.1109\/BigData.2018.8621955"},{"key":"ref88","first-page":"1929","article-title":"Dropout: A simple way to prevent neural networks from overfitting","volume":"15","author":"srivastava","year":"2014","journal-title":"J Mach Learn Res"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9312710\/09548039.pdf?arnumber=9548039","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,17]],"date-time":"2021-12-17T19:57:56Z","timestamp":1639771076000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9548039\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":99,"URL":"https:\/\/doi.org\/10.1109\/access.2021.3115665","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021]]}}}