{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,27]],"date-time":"2026-06-27T16:12:49Z","timestamp":1782576769466,"version":"3.54.5"},"reference-count":44,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/access.2022.3154410","type":"journal-article","created":{"date-parts":[[2022,2,24]],"date-time":"2022-02-24T20:26:31Z","timestamp":1645734391000},"page":"24181-24193","source":"Crossref","is-referenced-by-count":19,"title":["Bearing Fault Detection in ASD-Powered Induction Machine Using MODWT and Image Edge Detection"],"prefix":"10.1109","volume":"10","author":[{"given":"Victor","family":"Avina-Corral","sequence":"first","affiliation":[{"name":"Digital Systems Group, Electronics Department, Instituto Nacional de Astrofísica Óptica y Electrónica, Puebla, Mexico"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2785-5060","authenticated-orcid":false,"given":"Jose","family":"de Jesus Rangel-Magdaleno","sequence":"additional","affiliation":[{"name":"Digital Systems Group, Electronics Department, Instituto Nacional de Astrofísica Óptica y Electrónica, Puebla, Mexico"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hayde","family":"Peregrina-Barreto","sequence":"additional","affiliation":[{"name":"Computer Department, Instituto Nacional de Astrofísica Óptica y Electrónica, Puebla, Mexico"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8515-2489","authenticated-orcid":false,"given":"Juan Manuel","family":"Ramirez-Cortes","sequence":"additional","affiliation":[{"name":"Digital Systems Group, Electronics Department, Instituto Nacional de Astrofísica Óptica y Electrónica, Puebla, Mexico"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3061555"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.enconman.2021.114586"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2016.12.031"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3059466"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2833798"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2017.2706194"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/en14051218"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2021.01.036"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2498978"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2286931"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2021.116457"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2900143"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2010.11.019"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.09.013"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.triboint.2015.12.037"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-020-05033-z"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2011.6032830"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2016.006139"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.compeleceng.2013.12.020"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/s120911989"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2051398"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2123858"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3120975"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.renene.2019.06.094"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-015-6984-7"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2726011"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.2478\/amns.2020.1.00032"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2016.02.019"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108216"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.3390\/en14030712"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-019-04726-7"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-019-04729-4"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/s11668-021-01228-1"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.109287"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1177\/1687814020967874"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2016.03.007"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2018.8409780"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2834540"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2902344"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2919126"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.3390\/en13133481"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3012053"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2737879"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2570741"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9668973\/09721248.pdf?arnumber=9721248","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,17]],"date-time":"2024-01-17T22:54:46Z","timestamp":1705532086000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9721248\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":44,"URL":"https:\/\/doi.org\/10.1109\/access.2022.3154410","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}