{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T18:44:47Z","timestamp":1761677087789,"version":"3.37.3"},"reference-count":43,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100002850","name":"Agencia Nacional de Investigaci\u00f3n y Desarrollo (ANID) (Chile) through the Fondo Nacional de Desarrollo Cient\u00edfico y Tecnol\u00f3gico","doi-asserted-by":"publisher","award":["1181090","AC3E FB0008"],"award-info":[{"award-number":["1181090","AC3E FB0008"]}],"id":[{"id":"10.13039\/501100002850","id-type":"DOI","asserted-by":"publisher"}]},{"name":"MATH-AMSUD","award":["20-MATH-03"],"award-info":[{"award-number":["20-MATH-03"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/access.2022.3156078","type":"journal-article","created":{"date-parts":[[2022,3,2]],"date-time":"2022-03-02T20:34:42Z","timestamp":1646253282000},"page":"26529-26540","source":"Crossref","is-referenced-by-count":2,"title":["Point-Process Modeling and Divergence Measures Applied to the Characterization of Passenger Flow Patterns of a Metro System"],"prefix":"10.1109","volume":"10","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2474-1212","authenticated-orcid":false,"given":"Gabriel","family":"Vidal","sequence":"first","affiliation":[{"name":"Advanced Center for Electrical and Electronic Engineering, AC3E, Valparaíso, Chile"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9373-7065","authenticated-orcid":false,"given":"Juan I.","family":"Yuz","sequence":"additional","affiliation":[{"name":"Advanced Center for Electrical and Electronic Engineering, AC3E, Valparaíso, Chile"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5519-0946","authenticated-orcid":false,"given":"Ronny","family":"Vallejos","sequence":"additional","affiliation":[{"name":"Advanced Center for Electrical and Electronic Engineering, AC3E, Valparaíso, Chile"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4675-5201","authenticated-orcid":false,"given":"Felipe","family":"Osorio","sequence":"additional","affiliation":[{"name":"Department of Mathematics, Universidad Técnica Federico Santa María, Valparaíso, Chile"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/AUCC.2016.7868194"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-4818-1"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.sbspro.2012.09.826"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACSSC.2013.6810606"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1287\/trsc.2022.1128"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/0471200611"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1080\/2150704X.2016.1177241"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1111\/j.2517-6161.1977.tb01600.x"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s10696-021-09408-9"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1201\/9780429246593"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2019.108733"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2007.366913"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1214\/20-EJS1689"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/atr.1301"},{"volume-title":"Applied Multivariate Statistical Analysis","year":"2002","author":"Johnson","key":"ref15"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1002\/9780470316801"},{"volume-title":"Poisson Processes","year":"1993","author":"Kingman","key":"ref17"},{"volume-title":"Finding Groups in Data: An Introduction to Cluster Analysis","year":"1990","author":"Leonard","key":"ref18"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1111\/j.2517-6161.1982.tb01203.x"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1002\/SERIES1345"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/9780470191613"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/3132847.3133058"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2013.2262376"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.trc.2012.01.007"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1111\/1467-9868.00188"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/s41019-019-0091-y"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/rs12213585"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2020.106594"},{"volume-title":"Stochastic Processes","year":"1996","author":"Ross","key":"ref29"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/0377-0427(87)90125-7"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4612-3166-0"},{"volume-title":"Pattern Recognition","year":"2008","author":"Theodoridis","key":"ref32"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1111\/1467-9868.00293"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/0378-3758(95)00034-8"},{"volume-title":"All of Nonparametric Statistics","year":"2006","author":"Wasserman","key":"ref35"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ITSC.2005.1520157"},{"volume-title":"World Metro Figure 2018","year":"2018","key":"ref37"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1176346060"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1007\/s10115-007-0114-2"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/ITSC.2017.8317899"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ITSC.2015.443"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1111\/j.1467-8667.2007.00494.x"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1007\/s12469-020-00255-9"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9668973\/09726210.pdf?arnumber=9726210","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,17]],"date-time":"2024-01-17T23:30:49Z","timestamp":1705534249000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9726210\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":43,"URL":"https:\/\/doi.org\/10.1109\/access.2022.3156078","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2022]]}}}