{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,31]],"date-time":"2026-03-31T14:18:07Z","timestamp":1774966687879,"version":"3.50.1"},"reference-count":47,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/access.2022.3156890","type":"journal-article","created":{"date-parts":[[2022,3,4]],"date-time":"2022-03-04T20:21:49Z","timestamp":1646425309000},"page":"25892-25900","source":"Crossref","is-referenced-by-count":23,"title":["A Biasing Approach to Design Ultra-Low-Power Standard-Cell-Based Analog Building Blocks for Nanometer SoCs"],"prefix":"10.1109","volume":"10","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3880-2546","authenticated-orcid":false,"given":"Francesco","family":"Centurelli","sequence":"first","affiliation":[{"name":"Department of Information, Electronics and Communications Engineering, Sapienza University of Rome, Rome, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2181-2169","authenticated-orcid":false,"given":"Gianluca","family":"Giustolisi","sequence":"additional","affiliation":[{"name":"Dipartimento di Ingegneria Elettrica Elettronica e Informatica (DIEEI), University of Catania, Catania, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5803-484X","authenticated-orcid":false,"given":"Salvatore","family":"Pennisi","sequence":"additional","affiliation":[{"name":"Dipartimento di Ingegneria Elettrica Elettronica e Informatica (DIEEI), University of Catania, Catania, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5650-8212","authenticated-orcid":false,"given":"Giuseppe","family":"Scotti","sequence":"additional","affiliation":[{"name":"Department of Information, Electronics and Communications Engineering, Sapienza University of Rome, Rome, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1146\/annurev.bioeng.10.061807.160547"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2037648"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-51482-6"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2892604"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2014.6942125"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2804220"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2016.7527229"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3009652"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2938737"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2903464"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2255671"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2179732"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2746778"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2016.2530318"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2512935"},{"key":"ref16","first-page":"124","article-title":"First demonstration of a full 28 nm high-K\/metal gate circuit transfer from Bulk to UTBB FDSOI technology through hybrid integration","volume-title":"Proc. Symp. VLSI Circuits","author":"Golanski"},{"key":"ref17","first-page":"1","article-title":"22 nm FDSOI technology for emerging mobile, Internet-of-Things, and RF applications","volume-title":"IEDM Tech. Dig.","author":"Carter"},{"key":"ref18","first-page":"304","article-title":"A 2.5\u03bcW 0.0067 mm\u00b2 automatic back-biasing compensation unit achieving 50% leakage reduction in FDSOI 28 nm over 0.35-to-1V VDD range","author":"Quelen","year":"2018","journal-title":"IEEE ISSCC Dig. Tech. Papers"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2016.7573479"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2959544"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2018.8357299"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2012.6570809"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.803949"},{"key":"ref24","volume-title":"Wide-range local bias generator for body bias grid","author":"Tang","year":"2004"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2010.5537129"},{"key":"ref26","volume-title":"Integrated circuits with adjustable body bias and power supply circuitry","author":"Perisetty","year":"2010"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2014.7008858"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2011.6123641"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/PRIME.2017.7974125"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1049\/el:20051647"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/MCAS.2011.942751"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.3390\/jlpea11040037"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/4.823447"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.843602"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1002\/cta.464"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2009.2027954"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2090088"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2092994"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2194090"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1049\/el.2012.0711"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1049\/el.2012.3674"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2229070"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2364037"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2015.2476298"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2573920"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2619677"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2017.2756923"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9668973\/09729210.pdf?arnumber=9729210","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,17]],"date-time":"2024-01-17T23:49:36Z","timestamp":1705535376000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9729210\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":47,"URL":"https:\/\/doi.org\/10.1109\/access.2022.3156890","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}