{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,17]],"date-time":"2026-04-17T16:17:07Z","timestamp":1776442627579,"version":"3.51.2"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100007820","name":"Hangzhou Normal University Science Foundation","doi-asserted-by":"publisher","award":["2022QJJL08"],"award-info":[{"award-number":["2022QJJL08"]}],"id":[{"id":"10.13039\/501100007820","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/access.2022.3168861","type":"journal-article","created":{"date-parts":[[2022,4,20]],"date-time":"2022-04-20T19:33:32Z","timestamp":1650483212000},"page":"42542-42553","source":"Crossref","is-referenced-by-count":86,"title":["LPViT: A Transformer Based Model for PCB Image Classification and Defect Detection"],"prefix":"10.1109","volume":"10","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9498-5044","authenticated-orcid":false,"given":"Kang","family":"An","sequence":"first","affiliation":[{"name":"Qianjiang College, Hangzhou Normal University, Hangzhou, China"}]},{"given":"Yanping","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Computer Science, Gonzaga University, Spokane, WA, USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2009.5206848"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-16-2765-1_17"},{"key":"ref3","article-title":"Online PCB defect detector on a new PCB defect dataset","author":"Tang","year":"2019","journal-title":"arXiv:1902.06197"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.5120\/15240-3782"},{"key":"ref5","volume-title":"PCB Defect Detection and Classification Using Image Processing","author":"Kamalpreet","year":"2014"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/s21154968"},{"key":"ref7","volume-title":"Image Classification of PCBs and Its Web Application (Flask)","author":"Ankit","year":"2021"},{"key":"ref8","volume-title":"Machine Learning and Computer Vision for PCB Verification","author":"Yang","year":"2020"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.01559"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s41095-020-0199-z"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2021.3096854"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2021.102229"},{"key":"ref13","first-page":"1","article-title":"Attention is all you need","volume-title":"Proc. Conf. Neural Inf. Process. Syst. (NIPS)","author":"Vaswani"},{"key":"ref14","article-title":"BERT: Pre-training of deep bidirectional transformers for language understanding","author":"Devlin","year":"2018","journal-title":"arXiv:1810.04805"},{"key":"ref15","article-title":"ALBERT: A lite BERT for self-supervised learning of language representations","author":"Lan","year":"2019","journal-title":"arXiv:1909.11942"},{"key":"ref16","article-title":"RoBERTa: A robustly optimized BERT pretraining approach","author":"Liu","year":"2019","journal-title":"arXiv:1907.11692"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.18653\/v1\/P19-1139"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v34i05.6428"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-58452-8_13"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.00681"},{"key":"ref21","article-title":"An image is worth $16\\times16$\n words: Transformers for image recognition at scale","author":"Dosovitskiy","year":"2020","journal-title":"arXiv:2010.11929"},{"key":"ref22","article-title":"Training data-efficient image transformers & distillation through attention","author":"Touvron","year":"2020","journal-title":"arXiv:2012.12877"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.array.2019.100004"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2019.09.027"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.2214\/ajr.163.2.8037045"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3115\/v1\/d14-1179"},{"key":"ref27","article-title":"Bidirectional LSTM-CRF models for sequence tagging","author":"Huang","year":"2015","journal-title":"arXiv:1508.01991"},{"key":"ref28","article-title":"Explaining and harnessing adversarial examples","author":"Goodfellow","year":"2014","journal-title":"arXiv:1412.6572"},{"key":"ref29","article-title":"Adversarial machine learning at scale","author":"Kurakin","year":"2016","journal-title":"arXiv:1611.01236"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/EuroSP.2016.36"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.282"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00065"},{"key":"ref33","article-title":"Adam: A method for stochastic optimization","author":"Kingma","year":"2014","journal-title":"arXiv:1412.6980"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2577031"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9668973\/09760408.pdf?arnumber=9760408","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T22:15:17Z","timestamp":1705961717000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9760408\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":35,"URL":"https:\/\/doi.org\/10.1109\/access.2022.3168861","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}