{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,21]],"date-time":"2026-05-21T16:59:03Z","timestamp":1779382743431,"version":"3.53.1"},"reference-count":51,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"Ministry of Education, Science and Technological Development, Serbia, through the Innovative Scientific and Artistic Research from the Faculty of Technical Sciences Activity Domain","award":["451-03-68\/2022-14\/200156"],"award-info":[{"award-number":["451-03-68\/2022-14\/200156"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/access.2022.3170913","type":"journal-article","created":{"date-parts":[[2022,4,28]],"date-time":"2022-04-28T20:26:38Z","timestamp":1651177598000},"page":"46878-46894","source":"Crossref","is-referenced-by-count":8,"title":["Steady-State Multiple Parameters Estimation of the Inductive Power Transfer System"],"prefix":"10.1109","volume":"10","author":[{"given":"Zivadin","family":"Despotovic","sequence":"first","affiliation":[{"name":"Department of Power, Electronics and Telecommunication Engineering, Faculty of Technical Sciences, University of Novi Sad, Novi Sad, Serbia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6102-5995","authenticated-orcid":false,"given":"Dejan","family":"Reljic","sequence":"additional","affiliation":[{"name":"Department of Power, Electronics and Telecommunication Engineering, Faculty of Technical Sciences, University of Novi Sad, Novi Sad, Serbia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7634-1042","authenticated-orcid":false,"given":"Veran","family":"Vasic","sequence":"additional","affiliation":[{"name":"Department of Power, Electronics and Telecommunication Engineering, Faculty of Technical Sciences, University of Novi Sad, Novi Sad, Serbia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5750-2373","authenticated-orcid":false,"given":"Djura","family":"Oros","sequence":"additional","affiliation":[{"name":"Department of Power, Electronics and Telecommunication Engineering, Faculty of Technical Sciences, University of Novi Sad, Novi Sad, Serbia"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1982.317084"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2012.6311317"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2784345"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2013.2246531"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/WPT.2017.7953901"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMS.2019.8922021"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2757267"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2886424"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2864515"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/SeFet48154.2021.9375735"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2014.2343674"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2014.2319453"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2806917"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2767099"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2716968"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2393912"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s00202-020-00963-2"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2245041"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2453934"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2017.8096704"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-02562-5"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2011.0121"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2014.2332056"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2509962"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2793854"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2018.5194"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3003549"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2983465"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2952378"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2981651"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3084174"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3126884"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2935219"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.3390\/en12142728"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2020.3048026"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3032659"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2411755"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2019.2962738"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2021.3089419"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3088272"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10080906"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/WoW47795.2020.9291320"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3043229"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2937891"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2925388"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.2971583"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2873222"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/ICRERA.2012.6477400"},{"key":"ref49","article-title":"A test method for analog circuits: Using sensitivity analysis and the singular value decomposition","author":"van Spaandonk","year":"1996"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2817655"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2021.3077459"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9668973\/09764726.pdf?arnumber=9764726","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T21:50:14Z","timestamp":1705960214000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9764726\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":51,"URL":"https:\/\/doi.org\/10.1109\/access.2022.3170913","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}