{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,6]],"date-time":"2026-06-06T04:37:51Z","timestamp":1780720671447,"version":"3.54.1"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100003662","name":"Industrial Strategic Technology Development Program of Korea Evaluation Institute of Industrial Technology","doi-asserted-by":"publisher","award":["20010132"],"award-info":[{"award-number":["20010132"]}],"id":[{"id":"10.13039\/501100003662","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003662","name":"Industrial Strategic Technology Development Program of Korea Evaluation Institute of Industrial Technology","doi-asserted-by":"publisher","award":["20018501"],"award-info":[{"award-number":["20018501"]}],"id":[{"id":"10.13039\/501100003662","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/access.2022.3183347","type":"journal-article","created":{"date-parts":[[2022,6,15]],"date-time":"2022-06-15T20:04:51Z","timestamp":1655323491000},"page":"64483-64494","source":"Crossref","is-referenced-by-count":28,"title":["Fault Mechanism Analysis of Irreversible Demagnetization Due to the Dynamic Eccentricity of IPMSM for EV Traction"],"prefix":"10.1109","volume":"10","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6703-8917","authenticated-orcid":false,"given":"Jun-Kyu","family":"Kang","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Incheon National University, Incheon, Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0162-8225","authenticated-orcid":false,"given":"Jin","family":"Hur","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Incheon National University, Incheon, Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2018.2807377"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2013.2279555"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.918402"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2020.3033783"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2021.3089576"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2012.2198444"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3097906"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2650985"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2947401"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2006.879077"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2018.2828507"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2013.2272911"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2330067"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3066917"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3058541"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2263777"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2499162"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2029577"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3159675"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2016.2520950"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2017.2708319"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2016.2524589"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2007.899470"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2273471"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/28.475697"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2922919"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3131576"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2003.810198"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3010576"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2003.816480"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2549005"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2438872"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2016.2528998"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2020.2989799"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9668973\/09796535.pdf?arnumber=9796535","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T04:49:44Z","timestamp":1706762984000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9796535\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/access.2022.3183347","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}