{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T20:21:47Z","timestamp":1740169307027,"version":"3.37.3"},"reference-count":49,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/access.2022.3187140","type":"journal-article","created":{"date-parts":[[2022,6,29]],"date-time":"2022-06-29T19:40:16Z","timestamp":1656531616000},"page":"70187-70203","source":"Crossref","is-referenced-by-count":0,"title":["Rapid Design-Space Exploration for Low-Power Manycores Under Process Variation Utilizing Machine Learning"],"prefix":"10.1109","volume":"10","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3196-2635","authenticated-orcid":false,"given":"Sohaib","family":"Majzoub","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Sharjah, Sharjah, United Arab Emirates"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Resve","family":"Saleh","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, The University of British Columbia, Vancouver, BC, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9911-4846","authenticated-orcid":false,"given":"Mottaqiallah","family":"Taouil","sequence":"additional","affiliation":[{"name":"Laboratory of Computer Engineering, Delft University of Technology, CD Delft, The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8961-0387","authenticated-orcid":false,"given":"Said","family":"Hamdioui","sequence":"additional","affiliation":[{"name":"Laboratory of Computer Engineering, Delft University of Technology, CD Delft, The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohamed","family":"Bamakhrama","sequence":"additional","affiliation":[{"name":"Synopsys, AE Eindhoven, The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2593229"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IGCC.2015.7393688"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/2966986.2980080"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2900477"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2018.8351731"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310165"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3240765.3243483"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7927243"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2018.3011040"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMSCS.2017.2769046"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2591798"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2014.06.005"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2009.4810397"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/SOCC.2009.5335688"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2043587"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1166\/jolpe.2011.1123"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISSPIT.2006.270852"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2059270"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/2442087.2442095"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2017.7858403"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2700726"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2017.2772870"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2015.2512611"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2012.6164929"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/3477231.3490427"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CODES-ISSS.2013.6658995"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/2529992"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2504330"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2015.2446205"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2441721"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2017.08.042"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/NOCS.2012.12"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.3390\/s18093068"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/SOCCON.2009.5398022"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2018.07.011"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2018.8465821"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2017.2777863"},{"key":"ref38","first-page":"463","article-title":"Learning-based dynamic reliability management for dark silicon processor considering EM effects","volume-title":"Proc. Design, Autom. Test Eur. Conf. Exhib. (DATE)","author":"Kim"},{"key":"ref39","first-page":"1521","article-title":"Distributed reinforcement learning for power limited many-core system performance optimization","volume-title":"Proc. Design, Autom. Test Eur. Conf. Exhib. (DATE)","author":"Chen"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.222"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2102431"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/IPDPS.2014.88"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2014.6974718"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.4018\/978-1-5225-7862-8.ch011"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS48704.2020.9184490"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1145\/3418498"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIC.2019.8778056"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.156"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1002\/jos.116"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9668973\/09810244.pdf?arnumber=9810244","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T03:52:17Z","timestamp":1706759537000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9810244\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":49,"URL":"https:\/\/doi.org\/10.1109\/access.2022.3187140","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2022]]}}}