{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,6]],"date-time":"2026-06-06T17:18:32Z","timestamp":1780766312281,"version":"3.54.1"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/access.2022.3198669","type":"journal-article","created":{"date-parts":[[2022,8,15]],"date-time":"2022-08-15T19:51:16Z","timestamp":1660593076000},"page":"85606-85618","source":"Crossref","is-referenced-by-count":8,"title":["CAD Modeling of mm-Wave Circuits Incorporating Avalanche Noise Diodes"],"prefix":"10.1109","volume":"10","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8993-4197","authenticated-orcid":false,"given":"Guendalina","family":"Simoncini","sequence":"first","affiliation":[{"name":"Department of Engineering, University of Perugia, Perugia, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Daniele","family":"Dal Maistro","sequence":"additional","affiliation":[{"name":"Infineon Technologies Austria AG, Villach, Austria"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4523-2193","authenticated-orcid":false,"given":"Federico","family":"Alimenti","sequence":"additional","affiliation":[{"name":"Department of Engineering, University of Perugia, Perugia, Italy"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387343"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/rfic.2019.8701830"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2005.50"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2010.5488244"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2016.2549522"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2019.2926289"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2020.2980513"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2020.2975735"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3027384"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3053242"},{"key":"ref11","first-page":"57","article-title":"Sensitivity and accuracy of different radiometer types","volume-title":"Microwave Radiometer Systems: Design and Analysis","author":"Skou","year":"1989"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2009.2024305"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2008.921395"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3000675"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1966.15650"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1966.15652"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/1.1754620"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.1966.362378"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.1656784"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1969.16774"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/mop.10979"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICNF.2015.7288564"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS49266.2020.9294924"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/BIPOL.2006.311159"},{"key":"ref25","article-title":"Physical modelling of advanced SiGeTransistors","author":"Vytla","year":"2008"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2018.2800284"},{"key":"ref27","volume-title":"Application Note 57\u20131: Fundamental of RF and Microwave Noise Figure Measurements","year":"2000"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.6028\/NIST.TN.1327"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.6028\/NIST.TN.1390"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/22.739255"},{"issue":"3","key":"ref31","first-page":"12","article-title":"Noise figure measurement of highly mismatched DUT","volume":"12","author":"Sokol","year":"2003","journal-title":"Radioeng.-Prague"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.847218"},{"issue":"4","key":"ref33","first-page":"23","article-title":"Noise figure meter sets records for accuracy repeatability and convenience","volume":"34","author":"Swain","year":"1983","journal-title":"Hewlett-Packard J."}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9668973\/09856675.pdf?arnumber=9856675","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,11]],"date-time":"2024-12-11T02:10:03Z","timestamp":1733883003000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9856675\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/access.2022.3198669","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}