{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,21]],"date-time":"2025-11-21T18:11:58Z","timestamp":1763748718047,"version":"3.37.3"},"reference-count":53,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/access.2022.3205320","type":"journal-article","created":{"date-parts":[[2022,9,20]],"date-time":"2022-09-20T19:33:08Z","timestamp":1663702388000},"page":"96091-96099","source":"Crossref","is-referenced-by-count":20,"title":["ZnO Film Flexible Printed Circuit Board pH Sensor Measurement and Characterization"],"prefix":"10.1109","volume":"10","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8035-8023","authenticated-orcid":false,"given":"Po-Hui","family":"Yang","sequence":"first","affiliation":[{"name":"Graduate School of Electronic Engineering, National Yunlin University of Science and Technology, Douliou, Taiwan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Che-Tsung","family":"Chan","sequence":"additional","affiliation":[{"name":"Graduate School of Electronic Engineering, National Yunlin University of Science and Technology, Douliou, Taiwan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ying-Sheng","family":"Zhang","sequence":"additional","affiliation":[{"name":"Graduate School of Electronic Engineering, National Yunlin University of Science and Technology, Douliou, Taiwan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/S0925-4005(03)00039-X"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3160482"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3085829"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2021.3126671"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3131694"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.matpr.2020.04.197"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1002\/mop.32573"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijleo.2020.165562"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1364\/OE.447202"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1364\/OE.457958"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNB.2021.3082856"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1364\/PRJ.410168"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2020.128650"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3047878"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.aca.2012.05.048"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1021\/la7037697"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3390\/s91108911"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1155\/2013\/152079"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.rinp.2020.102976"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/taeece.2015.7113632"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/26\/35\/355202"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.jallcom.2010.03.174"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3027060"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1155\/2011\/269692"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3062857"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.tsf.2012.05.045"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2570285"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2012.10.113"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2018.2826013"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1115\/1.1462628"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2773143"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2012.2210274"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1021\/ed038p559"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2011.11.003"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.elecom.2020.106867"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2006.881364"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2009.2024045"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-4332(99)00601-7"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/0040-6090(95)08239-5"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/s00339-007-4275-3"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1021\/am300835p"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.progsurf.2006.12.002"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2550100"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2007.07.023"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1016\/j.mseb.2011.09.005"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.3390\/s90907445"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.3390\/s18020632"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3132359"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/ICEICE.2011.5777817"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2932627"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1007\/s00339-020-03466-w"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1016\/j.jallcom.2022.163955"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2018.01.120"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9668973\/09882115.pdf?arnumber=9882115","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T13:24:45Z","timestamp":1706793885000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9882115\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":53,"URL":"https:\/\/doi.org\/10.1109\/access.2022.3205320","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2022]]}}}