{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,28]],"date-time":"2026-03-28T17:42:16Z","timestamp":1774719736226,"version":"3.50.1"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100003787","name":"Natural Science Foundation of Hebei Province","doi-asserted-by":"publisher","award":["E2020202204"],"award-info":[{"award-number":["E2020202204"]}],"id":[{"id":"10.13039\/501100003787","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Central Funds Guiding the Local Science and Technology Development","award":["226Z2102G"],"award-info":[{"award-number":["226Z2102G"]}]},{"DOI":"10.13039\/501100004731","name":"Zhejiang Provincial Natural Science Foundation of China","doi-asserted-by":"publisher","award":["LGG20E070002"],"award-info":[{"award-number":["LGG20E070002"]}],"id":[{"id":"10.13039\/501100004731","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/access.2022.3206547","type":"journal-article","created":{"date-parts":[[2022,9,14]],"date-time":"2022-09-14T19:33:20Z","timestamp":1663184000000},"page":"97983-97994","source":"Crossref","is-referenced-by-count":17,"title":["A Novel Series Arc Fault Detection Method Based on Mel-Frequency Cepstral Coefficients and Fully Connected Neural Network"],"prefix":"10.1109","volume":"10","author":[{"given":"Yao","family":"Wang","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Hebei University of Technology, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2647-9027","authenticated-orcid":false,"given":"Dejie","family":"Sheng","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Hebei University of Technology, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3965-2300","authenticated-orcid":false,"given":"Haiqing","family":"Hu","sequence":"additional","affiliation":[{"name":"National Low Voltage Electrical Apparatus Quality Supervision and Inspection Center, Wenzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5123-0784","authenticated-orcid":false,"given":"Kefan","family":"Han","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Hebei University of Technology, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7434-8470","authenticated-orcid":false,"given":"Jiawang","family":"Zhou","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Hebei University of Technology, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0350-4928","authenticated-orcid":false,"given":"Linming","family":"Hou","sequence":"additional","affiliation":[{"name":"Zhejiang Testing and Inspection Institute for Mechanical and Electrical Products Quality Company Ltd., Hangzhou, China"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"Electricity Market Report\u2014July 2022","year":"2022"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2013.2272670"},{"key":"ref3","volume-title":"General Requirements for Arc Fault Detection Devices","year":"2013"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2016.10.008"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2627248"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2019.8721892"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/s20010162"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3027002"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3069849"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2018.05.009"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3115512"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2960512"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2018.11.002"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2880939"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICOIACT.2018.8350748"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICITEED.2018.8534807"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICENCO48310.2019.9027479"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CEIDP.2009.5377770"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/INFOP.2015.7489370"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2826878"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2885945"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2909267"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICICM50929.2020.9292218"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/CSE-EUC.2017.47"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9668973\/09889731.pdf?arnumber=9889731","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T21:20:08Z","timestamp":1705958408000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9889731\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/access.2022.3206547","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}