{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,6]],"date-time":"2026-03-06T23:19:38Z","timestamp":1772839178244,"version":"3.50.1"},"reference-count":44,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100018971","name":"Central Power Research Institute (CPRI), India","doi-asserted-by":"publisher","award":["CPRI\/R&D\/TANS\/2019"],"award-info":[{"award-number":["CPRI\/R&D\/TANS\/2019"]}],"id":[{"id":"10.13039\/501100018971","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/access.2022.3213690","type":"journal-article","created":{"date-parts":[[2022,10,10]],"date-time":"2022-10-10T20:08:36Z","timestamp":1665432516000},"page":"110785-110795","source":"Crossref","is-referenced-by-count":13,"title":["Numerical and Experimental Investigations on Influence of Internal Defect Parameters on Partial Discharge Induced UHF Signals in Gas Insulated Switchgear"],"prefix":"10.1109","volume":"10","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4169-7057","authenticated-orcid":false,"given":"Yugandhara Rao","family":"Yadam","sequence":"first","affiliation":[{"name":"Department of Engineering Design, Indian Institute of Technology Madras, Chennai, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1353-9588","authenticated-orcid":false,"given":"Ramanujam","family":"Sarathi","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology Madras, Chennai, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9532-5259","authenticated-orcid":false,"given":"Kavitha","family":"Arunachalam","sequence":"additional","affiliation":[{"name":"Department of Engineering Design, Indian Institute of Technology Madras, Chennai, India"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2005.1412214"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/EIC.2009.5166319"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2008.4712656"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-4560-75-7_95-1"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3403\/30253688"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2016.005887"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2015.0171"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2015.7303259"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2921089"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2019.8735667"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2988840"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2014.004391"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2006.1667746"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2007.4401231"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2008.4656241"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrd.2008.2008474"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2010.5595569"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2007.369534"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3126400"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CMD.2008.4580320"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2943625"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2554523"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2991158"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2018.2883828"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3090099"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1080\/09205071.2017.1380540"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2014.6832244"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2014.2351583"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.3390\/en10070942"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2013.2250316"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/icepe-st.2013.6804294"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/EIC49891.2021.9612308"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1080\/15325008.2011.596506"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2018.007738"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3033300"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2638804"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2896580"},{"key":"ref38","first-page":"1","article-title":"UHF partial discharge detection system for GIS: Application guide for sensitivity verification","volume-title":"Proc. VDE High Voltage Technol. ETG-Symp.","author":"Schichler"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.005535"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2011.6118622"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ICIINFS.2011.6038047"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2013.6678875"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2011.6032839"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ICHVE.2016.7800865"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9668973\/09915603.pdf?arnumber=9915603","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,24]],"date-time":"2024-01-24T02:18:05Z","timestamp":1706062685000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9915603\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":44,"URL":"https:\/\/doi.org\/10.1109\/access.2022.3213690","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}