{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T20:21:47Z","timestamp":1740169307138,"version":"3.37.3"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/100004358","name":"Samsung Electronics Company Ltd","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100004358","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Institute of Information and Communications Technology Planning and Evaluation"},{"DOI":"10.13039\/501100003621","name":"Korea Government (MSIT)","doi-asserted-by":"publisher","award":["2022-0-00971"],"award-info":[{"award-number":["2022-0-00971"]}],"id":[{"id":"10.13039\/501100003621","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/access.2022.3225193","type":"journal-article","created":{"date-parts":[[2022,11,28]],"date-time":"2022-11-28T19:37:30Z","timestamp":1669664250000},"page":"125319-125333","source":"Crossref","is-referenced-by-count":0,"title":["Improving NVM Lifetime Using Task Stack Migration on Low-End MCU-Based Devices"],"prefix":"10.1109","volume":"10","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1153-9736","authenticated-orcid":false,"given":"Jeongmin","family":"Lee","sequence":"first","affiliation":[{"name":"Department of Electronics Engineering, Hanyang University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3751-4630","authenticated-orcid":false,"given":"Moonseok","family":"Jang","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Hanyang University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kexin","family":"Wang","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Hanyang University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Inyeong","family":"Song","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Hanyang University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hyeonggyu","family":"Jeong","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Hanyang University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6485-0029","authenticated-orcid":false,"given":"Jinwoo","family":"Jeong","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Hanyang University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yong Ho","family":"Song","sequence":"additional","affiliation":[{"name":"Samsung Electronics, Hwaseong, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5691-4771","authenticated-orcid":false,"given":"Jungwook","family":"Choi","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Hanyang University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456923"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1555754.1555759"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/3139530"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669117"},{"key":"ref14","first-page":"279","article-title":"Curling-PCM: Application-specific wear leveling for phase change memory based embedded systems","author":"liu","year":"2013","journal-title":"Proc Asia and South Pacific Design Automation Conf (ASP-DAC)"},{"journal-title":"ARM Cortex-A57 MPCore Processor Technical Reference Manual","year":"2009","key":"ref15"},{"journal-title":"Simulation Control of Platforms and Modules User Guide Imperas Software Limited Simulation Control of Platforms and Modules User Guide","year":"2020","key":"ref16"},{"journal-title":"The FreertosT Reference Manual","year":"2017","key":"ref17"},{"article-title":"Mastering the freertos T real time kernel","year":"2016","author":"barry","key":"ref18"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/2627369.2627667"},{"key":"ref28","first-page":"1","article-title":"A wear-leveling-aware dynamic stack for PCM memory in embedded systems","author":"li","year":"2014","journal-title":"Proc Design Autom Test Eur Conf Exhibition (DATE)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2020.2976702"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICPADS.2016.0088"},{"article-title":"Machine learning on ARM cortex-M microcontroller","year":"2019","author":"suda","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2010.5548848"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD50377.2020.00102"},{"key":"ref5","first-page":"24","article-title":"High density embedded PCM cell in 28 nm FDSOI technology for automotive micro-controller applications","author":"arnaud","year":"2020","journal-title":"IEDM Tech Dig"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2012.6242460"},{"key":"ref7","first-page":"134t","article-title":"Novel highly scalable multi-level cell for STT-MRAM with stacked perpendicular MTJs","author":"aoki","year":"2013","journal-title":"Proc Symp VLSI Technol"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jksuci.2021.11.019"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2731959"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2014.6894354"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228439"},{"key":"ref22","first-page":"45","article-title":"Software wear management for persistent memories","author":"gogte","year":"2019","journal-title":"Proc 17th USENIX Conf File Storage Technol"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024939"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8715132"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2015.2395415"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/3483839"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/PCCC.2015.7410326"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/9668973\/09964379.pdf?arnumber=9964379","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,26]],"date-time":"2022-12-26T19:40:31Z","timestamp":1672083631000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9964379\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/access.2022.3225193","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2022]]}}}