{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,2]],"date-time":"2026-07-02T04:03:09Z","timestamp":1782964989682,"version":"3.54.5"},"reference-count":47,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100004530","name":"Universiti Putra Malaysia","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004530","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Tedfund Nigeria"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/access.2022.3231456","type":"journal-article","created":{"date-parts":[[2022,12,21]],"date-time":"2022-12-21T18:51:49Z","timestamp":1671648709000},"page":"2318-2326","source":"Crossref","is-referenced-by-count":26,"title":["Improving Cross-Project Software Defect Prediction Method Through Transformation and Feature Selection Approach"],"prefix":"10.1109","volume":"11","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0640-552X","authenticated-orcid":false,"given":"Yahaya Zakariyau","family":"Bala","sequence":"first","affiliation":[{"name":"Department of Software Engineering and Information System, Faculty of Computer Science and Information Technology, Universiti Putra Malaysia, Serdang, Malaysia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8915-7554","authenticated-orcid":false,"given":"Pathiah","family":"Abdul Samat","sequence":"additional","affiliation":[{"name":"Department of Software Engineering and Information System, Faculty of Computer Science and Information Technology, Universiti Putra Malaysia, Serdang, Malaysia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3894-1773","authenticated-orcid":false,"given":"Khaironi Yatim","family":"Sharif","sequence":"additional","affiliation":[{"name":"Department of Software Engineering and Information System, Faculty of Computer Science and Information Technology, Universiti Putra Malaysia, Serdang, Malaysia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Noridayu","family":"Manshor","sequence":"additional","affiliation":[{"name":"Department of Computer System, Faculty of Computer Science and Information Technology, Universiti Putra Malaysia, Serdang, Malaysia"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"issue":"216","key":"ref1","first-page":"1","article-title":"Cross-project defect prediction method based on manifold feature transformation","volume":"13","author":"Zhu","year":"2021","journal-title":"Future Internet"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MS.2005.129"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.4018\/978-1-7998-9158-1.ch036"},{"key":"ref4","first-page":"3090","article-title":"Research progress of software defect prediction","volume":"30","author":"Gong","year":"2019","journal-title":"J. Softw."},{"issue":"1","key":"ref5","first-page":"1","article-title":"Survey of static software defect prediction","volume":"27","author":"Chen","year":"2016","journal-title":"J. Softw."},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2011.103"},{"key":"ref7","first-page":"982","article-title":"Survey on data driven software defects prediction","volume":"45","author":"Li","year":"2017","journal-title":"Acta Electron."},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1049\/iet-sen.2017.0148"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-008-9103-7"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/1595696.1595713"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-016-9468-y"},{"key":"ref12","first-page":"254","article-title":"A survey on cross-project software defect prediction methods","volume":"41","author":"Chen","year":"2018","journal-title":"Chin. J. Comput."},{"issue":"2","key":"ref13","first-page":"266","article-title":"Domain adaptation approach for cross-project software defect prediction","volume":"31","author":"Chen","year":"2020","journal-title":"J. Softw."},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.26599\/TST.2020.9010040"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1477\/3\/032011"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MSR.2013.6624057"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2011.09.007"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2543218"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2020.106940"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2013.6606584"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2804922"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/s10515-017-0220-7"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2022.106985"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/sym14020401"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2021.114637"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2021.3074660"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2002.1019484"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1155\/2018\/2650415"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/2499393.2499395"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2972644"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/s11219-021-09553-2"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2873755"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/QRS.2017.53"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/IBF.2019.8665492"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.3390\/a12010013"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2018.12.091"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1155\/2022\/2320447"},{"key":"ref38","first-page":"1308","article-title":"Cross-project defect prediction method based on feature transfer and instance transfer","volume":"30","author":"Ni","year":"2019","journal-title":"J. Softw."},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2018.11.005"},{"key":"ref40","first-page":"197","article-title":"Cross-project defect prediction method based on instance filtering and transfer","volume":"46","author":"Fan","year":"2020","journal-title":"Comput. Eng."},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1007\/s10796-013-9430-0"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/COMPSAC.2014.66"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1631\/FITEE.1601322"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ICRITO48877.2020.9197799"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.3390\/app10051745"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2007.07.040"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1007\/s11704-017-6015-y"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10005208\/09996402.pdf?arnumber=9996402","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,2]],"date-time":"2024-03-02T11:35:23Z","timestamp":1709379323000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9996402\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":47,"URL":"https:\/\/doi.org\/10.1109\/access.2022.3231456","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}