{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,19]],"date-time":"2025-09-19T10:49:26Z","timestamp":1758278966755,"version":"3.37.3"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/access.2023.3238875","type":"journal-article","created":{"date-parts":[[2023,1,23]],"date-time":"2023-01-23T19:38:54Z","timestamp":1674502734000},"page":"8870-8877","source":"Crossref","is-referenced-by-count":1,"title":["Fast and Easy Sensor Adaptation With Self-Training"],"prefix":"10.1109","volume":"11","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9597-733X","authenticated-orcid":false,"given":"Jinhyuk","family":"Choi","sequence":"first","affiliation":[{"name":"Samsung Advanced Institute of Technology, Yeongtong-gu, Suwon-si, Gyeonggi-do, South Korea"}]},{"given":"Byeongju","family":"Lee","sequence":"additional","affiliation":[{"name":"Samsung Advanced Institute of Technology, Yeongtong-gu, Suwon-si, Gyeonggi-do, South Korea"}]},{"given":"Seho","family":"Shin","sequence":"additional","affiliation":[{"name":"Samsung Advanced Institute of Technology, Yeongtong-gu, Suwon-si, Gyeonggi-do, South Korea"}]},{"given":"Daehyun","family":"Ji","sequence":"additional","affiliation":[{"name":"Samsung Advanced Institute of Technology, Yeongtong-gu, Suwon-si, Gyeonggi-do, South Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2012.6248074"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.48550\/ARXIV.1604.01685"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00352"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.00889"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01237"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01174"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.5555\/3045118.3045167"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00753"},{"key":"ref9","first-page":"10276","article-title":"Learning to self-train for semi-supervised few-shot classification","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"32","author":"Li"},{"key":"ref10","article-title":"Efficient self-supervised vision transformers for representation learning","author":"Li","year":"2021","journal-title":"arXiv:2106.09785"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.01139"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.01485"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tnnls.2022.3152527"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10618-016-0475-9"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.00522"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.00935"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.00743"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.324"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.169"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2020.3002345"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.106"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.111"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10005208\/10024297.pdf?arnumber=10024297","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,13]],"date-time":"2024-02-13T08:58:05Z","timestamp":1707814685000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10024297\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/access.2023.3238875","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2023]]}}}