{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,29]],"date-time":"2026-01-29T21:58:27Z","timestamp":1769723907370,"version":"3.49.0"},"reference-count":42,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100013064","name":"Key Research and Development Program of Jiangxi Province, China","doi-asserted-by":"publisher","award":["20202BBEL53002"],"award-info":[{"award-number":["20202BBEL53002"]}],"id":[{"id":"10.13039\/501100013064","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004479","name":"Natural Science Foundation of Jiangxi Province","doi-asserted-by":"publisher","award":["20212BAB212009"],"award-info":[{"award-number":["20212BAB212009"]}],"id":[{"id":"10.13039\/501100004479","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/access.2023.3239266","type":"journal-article","created":{"date-parts":[[2023,1,23]],"date-time":"2023-01-23T19:38:54Z","timestamp":1674502734000},"page":"7933-7946","source":"Crossref","is-referenced-by-count":7,"title":["A Method-Level Defect Prediction Approach Based on Structural Features of Method-Calling Network"],"prefix":"10.1109","volume":"11","author":[{"given":"Fengyu","family":"Yang","sequence":"first","affiliation":[{"name":"School of Software, Nanchang Hangkong University, Nanchang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6289-8379","authenticated-orcid":false,"given":"Haoming","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Software, Nanchang Hangkong University, Nanchang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Peng","family":"Xiao","sequence":"additional","affiliation":[{"name":"School of Software, Nanchang Hangkong University, Nanchang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fa","family":"Zhong","sequence":"additional","affiliation":[{"name":"School of Software, Nanchang Hangkong University, Nanchang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Guangdong","family":"Zeng","sequence":"additional","affiliation":[{"name":"School of Software, Nanchang Hangkong University, Nanchang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSM.2010.5609530"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3475716.3475790"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3238147.3240469"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2372251.2372285"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2012.6227193"},{"key":"ref6","first-page":"554","article-title":"An investigation of cross-project learning in online just-in-time software defect prediction","volume-title":"Proc. Int. Conf. Softw. Eng. (ICSE)","author":"Tabassum"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2020.3023177"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2005.49"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/SANER.2018.8330264"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2021.3131950"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s11432-015-5426-3"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/2939672.2939754"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2584050"},{"key":"ref14","first-page":"132","article-title":"Cross version defect prediction with representative data via sparse subset selection","volume-title":"Proc. 26th Conf. Program Comprehension","author":"Xu"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2543218"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2020.3001739"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2015.09.001"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2019.2892959"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2018.2877612"},{"key":"ref20","first-page":"578","article-title":"Software visualization and deep transfer learning for effective software defect prediction","volume-title":"Proc. ACM\/IEEE 42nd Int. Conf. Softw. Eng.","author":"Chen"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2020.3040191"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/2884781.2884804"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3051957"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2007.256941"},{"key":"ref25","volume-title":"Elements of Software Science","author":"Halsted","year":"1977"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1976.233837"},{"key":"ref27","first-page":"69","article-title":"Using object-oriented design metrics to predict software defects","volume-title":"Proc. Models Methods Syst. Dependability","author":"Jureczko"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/32.689404"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/3383219.3383243"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/2693208.2693223"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2018.03.022"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/2623330.2623732"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1145\/3110025.3110086"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1145\/2939672.2939753"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1145\/2806416.2806512"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1145\/2736277.2741093"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2019.00076"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2020.106432"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2015.91"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1145\/2961111.2962620"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2013.6693087"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-018-9661-2"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10005208\/10024780.pdf?arnumber=10024780","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,13]],"date-time":"2024-02-13T08:16:56Z","timestamp":1707812216000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10024780\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":42,"URL":"https:\/\/doi.org\/10.1109\/access.2023.3239266","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}