{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T20:21:39Z","timestamp":1740169299973,"version":"3.37.3"},"reference-count":42,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/access.2023.3247139","type":"journal-article","created":{"date-parts":[[2023,2,28]],"date-time":"2023-02-28T18:52:46Z","timestamp":1677610366000},"page":"18620-18630","source":"Crossref","is-referenced-by-count":0,"title":["Toward a Monolithic Pixel Sensor for Heavy Ion Spectroscopy\u2014Pixel Structure Design and Optimization"],"prefix":"10.1109","volume":"11","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2683-6255","authenticated-orcid":false,"given":"Yaron H.","family":"Cohen","sequence":"first","affiliation":[{"name":"Faculty of Electrical Engineering, Bar-Ilan University, Ramat Gan, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yoav","family":"Weizman","sequence":"additional","affiliation":[{"name":"Faculty of Electrical Engineering, Bar-Ilan University, Ramat Gan, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0082-3694","authenticated-orcid":false,"given":"Yoav","family":"Simhony","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Tel Aviv University, Tel Aviv, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Miki","family":"Moyal","sequence":"additional","affiliation":[{"name":"Gigalog Ltd, Haifa, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Evgeniy","family":"Kuksin","sequence":"additional","affiliation":[{"name":"Gigalog Ltd, Haifa, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alexander","family":"Fish","sequence":"additional","affiliation":[{"name":"Faculty of Electrical Engineering, Bar-Ilan University, Ramat Gan, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/5.90113"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pone.0096099"},{"article-title":"An introduction to space radiation effects on microelectronics","year":"2000","author":"Edmonds","key":"ref3"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1017\/cbo9780511862335.016"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-94-011-4762-0_14"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.pss.2016.03.009"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/BF00211546"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/BF01342532"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.342483"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1029\/2010SW000641"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/S0920-5632(02)01824-8"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/4.972156"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2013.05.073"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-9002(00)00893-7"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1117\/12.450826"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/s8095336"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2016.05.016"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2018.10.006"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2013.03.017"},{"key":"ref20","first-page":"157","article-title":"Heavy ion and proton SEL characterisation on selected eee component types used in ISS equipment","volume":"536","author":"Reinecke","year":"2004"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1142\/5553"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-9002(01)00361-8"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-9002(00)01286-9"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/s21061990"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1029\/2019SW002344"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1088\/1748-0221\/6\/06\/P06013"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/23.490901"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/S0092-640X(70)80016-X"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1103\/RevModPhys.60.663"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1080\/14786441008635432"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevA.53.2443"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.910850"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/1359-0189(86)90057-9"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1063\/1.356274"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/16.554806"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2006.04.071"},{"volume-title":"Sentaurus TCAD","year":"2023","key":"ref37"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2017.07.046"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2006.881910"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2008.03.100"},{"key":"ref41","first-page":"55","article-title":"Studying the total ionizing dose and displacement damage dose effects for various orbital trajectories","volume-title":"Proc. 1st Middle East-Africa Regional IAU Meeting","author":"Samwel"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2022.167049"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10005208\/10049403.pdf?arnumber=10049403","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,13]],"date-time":"2024-02-13T18:12:28Z","timestamp":1707847948000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10049403\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":42,"URL":"https:\/\/doi.org\/10.1109\/access.2023.3247139","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2023]]}}}