{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,3]],"date-time":"2026-04-03T06:59:14Z","timestamp":1775199554536,"version":"3.50.1"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea (NRF) through the Korean Government, Ministry of Science and ICT","doi-asserted-by":"publisher","award":["2021R1A2C1011154"],"award-info":[{"award-number":["2021R1A2C1011154"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/access.2023.3263527","type":"journal-article","created":{"date-parts":[[2023,3,31]],"date-time":"2023-03-31T17:49:10Z","timestamp":1680284950000},"page":"33005-33013","source":"Crossref","is-referenced-by-count":10,"title":["Improving Bit-Error-Rate Performance Using Modulation Coding Techniques for Spin-Torque Transfer Magnetic Random Access Memory"],"prefix":"10.1109","volume":"11","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1259-0066","authenticated-orcid":false,"given":"Thien An","family":"Nguyen","sequence":"first","affiliation":[{"name":"Department of Information Communication Convergence Technology, Soongsil University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7791-3308","authenticated-orcid":false,"given":"Jaejin","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Information Communication Convergence Technology, Soongsil University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2013.6507427"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2005.1609379"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2010.5433943"},{"key":"ref4","first-page":"87","article-title":"Improving STT MRAM storage density through smaller-than-worst-case transistor sizing","volume-title":"Proc. 46th Annu. Design Autom. Conf.","author":"Xu"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2008.4479820"},{"key":"ref6","first-page":"554","article-title":"Circuit and microarchitecture evaluation of 3D stacking magnetic RAM (MRAM) as a universal memory replacement","volume-title":"Proc. 45th Annu. Design Autom. Conf.","author":"Dong"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISLPED.2011.5993623"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/1.2837800"},{"key":"ref9","volume-title":"16Mb MRAM-Parallel Interface","year":"2018"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/SiPS.2012.11"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.7873\/DATE2014.195"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1186\/1687-6180-2012-211"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/18.748992"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.12720\/jcm.8.4.225-232"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2959837"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2903592"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2017.2701880"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3134282"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/3287624.3287686"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2018.8342194"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2436389"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176695"},{"key":"ref23","first-page":"88","article-title":"Probabilistic design methodology to improve run-time stability and performance of STT-RAM caches","volume-title":"Proc. Int. Conf. Comput.-Aided Design","author":"Bi"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/s11227-022-04394-7"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2019.2923258"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2027907"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2011.2169456"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2017.2711245"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2016.9"},{"key":"ref30","volume-title":"Digital Communications","author":"Proakis","year":"1995"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2010.2042041"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2014.6894366"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2011.6105370"},{"key":"ref34","first-page":"1","article-title":"Area, power, and latency considerations of STT-MRAM to substitute for main memory","volume-title":"Proc. ISCA","author":"Jin"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2016.2608910"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ICC.2019.8761243"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10005208\/10089452.pdf?arnumber=10089452","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,3]],"date-time":"2024-03-03T10:58:29Z","timestamp":1709463509000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10089452\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/access.2023.3263527","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}