{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,19]],"date-time":"2026-05-19T15:25:46Z","timestamp":1779204346919,"version":"3.51.4"},"reference-count":321,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/access.2023.3271748","type":"journal-article","created":{"date-parts":[[2023,5,1]],"date-time":"2023-05-01T18:42:16Z","timestamp":1682966536000},"page":"43370-43423","source":"Crossref","is-referenced-by-count":96,"title":["Deep Learning for Automatic Vision-Based Recognition of Industrial Surface Defects: A Survey"],"prefix":"10.1109","volume":"11","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7601-4212","authenticated-orcid":false,"given":"Michela","family":"Prunella","sequence":"first","affiliation":[{"name":"Department of Electrical and Information Engineering (DEI), Polytechnic University of Bari, Bari, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7973-1564","authenticated-orcid":false,"given":"Roberto Maria","family":"Scardigno","sequence":"additional","affiliation":[{"name":"Department of Electrical and Information Engineering (DEI), Polytechnic University of Bari, Bari, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2024-5369","authenticated-orcid":false,"given":"Domenico","family":"Buongiorno","sequence":"additional","affiliation":[{"name":"Department of Electrical and Information Engineering (DEI), Polytechnic University of Bari, Bari, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1934-0983","authenticated-orcid":false,"given":"Antonio","family":"Brunetti","sequence":"additional","affiliation":[{"name":"Department of Electrical and Information Engineering (DEI), Polytechnic University of Bari, Bari, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nicola","family":"Longo","sequence":"additional","affiliation":[{"name":"Apulian Bioengineering S.r.l., Modugno, Bari, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9184-6017","authenticated-orcid":false,"given":"Raffaele","family":"Carli","sequence":"additional","affiliation":[{"name":"Department of Electrical and Information Engineering (DEI), Polytechnic University of Bari, Bari, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1459-3452","authenticated-orcid":false,"given":"Mariagrazia","family":"Dotoli","sequence":"additional","affiliation":[{"name":"Department of Electrical and Information Engineering (DEI), Polytechnic University of Bari, Bari, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3088-0788","authenticated-orcid":false,"given":"Vitoantonio","family":"Bevilacqua","sequence":"additional","affiliation":[{"name":"Department of Electrical and Information Engineering (DEI), Polytechnic University of Bari, Bari, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref57","first-page":"5046","article-title":"Learning to learn from noisy labeled data","author":"li","year":"2018","journal-title":"Proc IEEE Conf Comput Vis and Pattern Recog"},{"key":"ref207","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3021189"},{"key":"ref56","article-title":"Learning trustworthy model from noisy labels based on rough set for surface defect detection","author":"niu","year":"2023","journal-title":"arXiv 2301 10441"},{"key":"ref208","doi-asserted-by":"publisher","DOI":"10.1109\/ICMCCE51767.2020.00290"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3137633"},{"key":"ref205","doi-asserted-by":"publisher","DOI":"10.1109\/M2VIP49856.2021.9665143"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3219493"},{"key":"ref206","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3124525"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-020-01400-4"},{"key":"ref203","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2021.106892"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3196447"},{"key":"ref204","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP42928.2021.9506433"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2022.3176915"},{"key":"ref201","doi-asserted-by":"publisher","DOI":"10.1142\/S0129065722500307"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3077847"},{"key":"ref202","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3199228"},{"key":"ref209","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-58520-4_29"},{"key":"ref210","doi-asserted-by":"publisher","DOI":"10.1177\/0040517519862880"},{"key":"ref211","doi-asserted-by":"publisher","DOI":"10.1109\/ICTEmSys.2019.8695928"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.3390\/app12083967"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2021.12.008"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3126098"},{"key":"ref218","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2016.7533042"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2021.3058147"},{"key":"ref219","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3009654"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1186\/s40537-021-00414-0"},{"key":"ref216","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2984453"},{"key":"ref47","article-title":"Image data augmentation for deep learning: A survey","author":"yang","year":"2022","journal-title":"arXiv 2204 08610"},{"key":"ref217","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2015.2437384"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2017.2668395"},{"key":"ref214","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3026801"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2016.04.072"},{"key":"ref215","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3186054"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3214285"},{"key":"ref212","doi-asserted-by":"publisher","DOI":"10.3390\/s18041064"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3025642"},{"key":"ref213","first-page":"312","article-title":"Defects detection based on deep learning and transfer learning","volume":"7","author":"liu","year":"2015","journal-title":"Metall Min Ind"},{"key":"ref49","doi-asserted-by":"crossref","DOI":"10.1186\/s40537-019-0197-0","article-title":"A survey on image data augmentation for deep learning","volume":"6","author":"shorten","year":"2019","journal-title":"J Big Data"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/app10238629"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2021.3109353"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICIT.2017.7915495"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.18494\/SAM.2020.3101"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/aerospace9090480"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1115\/1.4049535"},{"key":"ref5","first-page":"1","article-title":"An intelligent belt wear fault diagnosis method based on deep learning","volume":"43","author":"wang","year":"2022","journal-title":"Int J Coal Preparation Utilization"},{"key":"ref100","doi-asserted-by":"publisher","DOI":"10.3390\/met12020311"},{"key":"ref221","first-page":"779","article-title":"You only look once: Unified, real-time object detection","author":"redmon","year":"2015","journal-title":"Proc IEEE Conf Comput Vis Pattern Recognit"},{"key":"ref101","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2022.01.004"},{"key":"ref222","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.324"},{"key":"ref40","first-page":"1","article-title":"The PRISMA 2020 statement: An updated guideline for reporting systematic reviews","volume":"372","author":"page","year":"2021","journal-title":"BMJ"},{"key":"ref220","first-page":"1","article-title":"SSD: Single shot MultiBox detector","author":"liu","year":"2015","journal-title":"Proc Eur Conf Comput Vis"},{"key":"ref35","article-title":"Visual anomaly detection for images: A survey","author":"yang","year":"2021","journal-title":"arXiv 2109 13157"},{"key":"ref306","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2022.3167412"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.3390\/app11167657"},{"key":"ref307","article-title":"Disentangling factors of variation with cycle-consistent variational auto-encoders","author":"harsh jha","year":"2018","journal-title":"arXiv 1804 10469"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.14569\/IJACSA.2022.0130439"},{"key":"ref304","doi-asserted-by":"publisher","DOI":"10.1145\/966789.966807"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2021.05.008"},{"key":"ref305","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3086028"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.3390\/s20051459"},{"key":"ref302","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2020.3027314"},{"key":"ref30","article-title":"A survey of surface defect detection of industrial products based on a small number of labeled data","author":"jin","year":"2022","journal-title":"arXiv 2203 05733"},{"key":"ref303","first-page":"111","article-title":"Score-CAM: Score-weighted visual explanations for convolutional neural networks","author":"wang","year":"2019","journal-title":"Proc IEEE\/CVF Conf Comput Vis Pattern Recognit Workshops"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/s40684-021-00343-6"},{"key":"ref300","article-title":"Distilling the knowledge in a neural network","author":"hinton","year":"2015","journal-title":"ArXiv 1503 02531"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-021-06592-8"},{"key":"ref301","doi-asserted-by":"publisher","DOI":"10.1002\/sdtp.15658"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3234030"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.3390\/s22176321"},{"key":"ref308","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2017.2699184"},{"key":"ref309","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00913"},{"key":"ref310","article-title":"An image is worth 16&#x00D7;16 words: Transformers for image recognition at scale","author":"dosovitskiy","year":"2020","journal-title":"arXiv 2010 11929"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/electronics11152383"},{"key":"ref317","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2020.3004555"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.11591\/ijece.v13i2.pp2156-2166"},{"key":"ref318","doi-asserted-by":"crossref","first-page":"135","DOI":"10.1016\/j.neucom.2018.05.083","article-title":"Deep visual domain adaptation: A survey","volume":"312","author":"mei","year":"2018","journal-title":"Neurocomputing"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1155\/2021\/9948808"},{"key":"ref315","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2017.09.030"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2957427"},{"key":"ref316","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3201201"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1155\/2020\/8189403"},{"key":"ref313","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00986"},{"key":"ref314","doi-asserted-by":"publisher","DOI":"10.1145\/3422622"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1111\/exsy.12754"},{"key":"ref311","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2022.3152247"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3106171"},{"key":"ref312","doi-asserted-by":"publisher","DOI":"10.1145\/3505244"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3217227"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3196436"},{"key":"ref319","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2009.5206848"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2020.3034884"},{"key":"ref320","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-79463-7_43"},{"key":"ref200","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2022.3204368"},{"key":"ref321","doi-asserted-by":"publisher","DOI":"10.1109\/WACV.2018.00097"},{"key":"ref128","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2022.110001"},{"key":"ref249","doi-asserted-by":"publisher","DOI":"10.1016\/j.ceramint.2022.09.272"},{"key":"ref129","doi-asserted-by":"publisher","DOI":"10.3390\/app12031249"},{"key":"ref97","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2019.02.123"},{"key":"ref126","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2019.01.011"},{"key":"ref247","article-title":"YOLOv3: An incremental improvement","author":"redmon","year":"2018","journal-title":"arXiv 1804 02767"},{"key":"ref96","doi-asserted-by":"publisher","DOI":"10.1007\/s12541-019-00074-4"},{"key":"ref127","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-023-08283-9"},{"key":"ref248","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2022.102470"},{"key":"ref99","doi-asserted-by":"publisher","DOI":"10.2355\/isijinternational.ISIJINT-2018-722"},{"key":"ref124","doi-asserted-by":"publisher","DOI":"10.1007\/s10489-021-02917-y"},{"key":"ref245","doi-asserted-by":"publisher","DOI":"10.2355\/isijinternational.ISIJINT-2019-335"},{"key":"ref98","doi-asserted-by":"publisher","DOI":"10.1016\/j.promfg.2020.05.128"},{"key":"ref125","doi-asserted-by":"publisher","DOI":"10.1007\/s00138-022-01286-x"},{"key":"ref246","article-title":"DenseBox: Unifying landmark localization with end to end object detection","author":"huang","year":"2015","journal-title":"arXiv 1509 04874"},{"key":"ref93","first-page":"99102","article-title":"Explainable deep learning system for advanced silicon and silicon carbide electrical wafer defect map assessment","volume":"4","author":"sarpietro","year":"2016","journal-title":"IEEE Access"},{"key":"ref133","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3169535"},{"key":"ref254","doi-asserted-by":"publisher","DOI":"10.1177\/15589250211008346"},{"key":"ref92","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2896165"},{"key":"ref134","doi-asserted-by":"publisher","DOI":"10.1007\/s10015-022-00797-0"},{"key":"ref255","article-title":"EfficientNet: Rethinking model scaling for convolutional neural networks","author":"tan","year":"2019","journal-title":"arXiv 1905 11946"},{"key":"ref95","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmapro.2021.08.034"},{"key":"ref131","doi-asserted-by":"publisher","DOI":"10.1109\/CAC48633.2019.8997079"},{"key":"ref252","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3022405"},{"key":"ref94","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-022-09425-4"},{"key":"ref132","doi-asserted-by":"publisher","DOI":"10.1109\/DASC\/PiCom\/DataCom\/CyberSciTec.2018.00051"},{"key":"ref253","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00474"},{"key":"ref250","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-022-10763-6"},{"key":"ref130","doi-asserted-by":"publisher","DOI":"10.5937\/fmet1904765K"},{"key":"ref251","doi-asserted-by":"publisher","DOI":"10.1016\/j.rineng.2023.100968"},{"key":"ref91","doi-asserted-by":"publisher","DOI":"10.3390\/app11020576"},{"key":"ref90","doi-asserted-by":"publisher","DOI":"10.1007\/s10921-020-0655-9"},{"key":"ref89","doi-asserted-by":"publisher","DOI":"10.1007\/s10921-020-0668-4"},{"key":"ref139","doi-asserted-by":"publisher","DOI":"10.1109\/IECON43393.2020.9255204"},{"key":"ref86","first-page":"1279","article-title":"Gear classification for defect detection in vision inspection system using deep convolutional neural networks","volume":"9","author":"kamal","year":"2018","journal-title":"ICIC Exp Lett B Appl"},{"key":"ref137","doi-asserted-by":"publisher","DOI":"10.1109\/ICTC52510.2021.9620801"},{"key":"ref258","doi-asserted-by":"publisher","DOI":"10.3390\/s22249926"},{"key":"ref85","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2020.2967415"},{"key":"ref138","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2020.106324"},{"key":"ref259","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2020.101037"},{"key":"ref88","doi-asserted-by":"publisher","DOI":"10.3390\/app9071364"},{"key":"ref135","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2022.108313"},{"key":"ref256","doi-asserted-by":"publisher","DOI":"10.1155\/2022\/4637939"},{"key":"ref87","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA.2019.8869084"},{"key":"ref136","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3069466"},{"key":"ref257","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3127648"},{"key":"ref82","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2020.06.107"},{"key":"ref144","article-title":"Wasserstein GAN","author":"arjovsky","year":"2017","journal-title":"arXiv 1701 07875"},{"key":"ref265","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2022.05.021"},{"key":"ref81","doi-asserted-by":"publisher","DOI":"10.3390\/met11030388"},{"key":"ref145","doi-asserted-by":"publisher","DOI":"10.3390\/met11060870"},{"key":"ref266","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-022-09716-w"},{"key":"ref84","doi-asserted-by":"publisher","DOI":"10.3389\/fmech.2022.824038"},{"key":"ref142","doi-asserted-by":"publisher","DOI":"10.1109\/AIM.2018.8452228"},{"key":"ref263","doi-asserted-by":"publisher","DOI":"10.3390\/asi6010025"},{"key":"ref83","first-page":"1","article-title":"Automated surface defect detection framework using machine vision and convolutional neural networks","volume":"34","author":"singh","year":"2022","journal-title":"J Intell Manuf"},{"key":"ref143","doi-asserted-by":"publisher","DOI":"10.1016\/j.procs.2017.09.040"},{"key":"ref264","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3204332"},{"key":"ref140","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2020.106539"},{"key":"ref261","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2020.2983050"},{"key":"ref141","doi-asserted-by":"publisher","DOI":"10.3390\/s18113709"},{"key":"ref262","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3235461"},{"key":"ref80","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-022-02034-8"},{"key":"ref260","doi-asserted-by":"publisher","DOI":"10.1007\/s12289-019-01496-1"},{"key":"ref79","doi-asserted-by":"publisher","DOI":"10.1155\/2022\/9680519"},{"key":"ref108","first-page":"627","article-title":"Research on surface defects detection of reflected curved surface based on convolutional neural networks","volume":"10","author":"zhang","year":"2019","journal-title":"ICIC Exp Lett B Appl"},{"key":"ref229","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-017-0882-0"},{"key":"ref78","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3107586"},{"key":"ref109","doi-asserted-by":"publisher","DOI":"10.1109\/DASC\/PiCom\/CBDCom\/CyberSciTech.2019.00067"},{"key":"ref106","doi-asserted-by":"publisher","DOI":"10.1016\/j.mfglet.2022.11.006"},{"key":"ref227","article-title":"A lightweight one-stage defect detection network for small object based on dual attention mechanism and PAFPN","volume":"9","author":"zhang","year":"2021","journal-title":"Frontiers in Physiology"},{"key":"ref107","doi-asserted-by":"publisher","DOI":"10.3390\/app9061085"},{"key":"ref228","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2021.3096067"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.3390\/ma13204629"},{"key":"ref104","doi-asserted-by":"publisher","DOI":"10.1007\/s40745-022-00437-1"},{"key":"ref225","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108885"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1007\/s12652-021-03688-7"},{"key":"ref105","doi-asserted-by":"publisher","DOI":"10.1155\/2022\/1070405"},{"key":"ref226","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.112467"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3168897"},{"key":"ref102","doi-asserted-by":"publisher","DOI":"10.3390\/app12136569"},{"key":"ref223","doi-asserted-by":"publisher","DOI":"10.1155\/2019\/3140980"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3021482"},{"key":"ref103","article-title":"Object discovery with a copy-pasting GAN","author":"arandjelovi?","year":"2019","journal-title":"arXiv 1905 11369"},{"key":"ref224","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-020-01670-2"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref111","first-page":"2818","article-title":"Rethinking the inception architecture for computer vision","author":"szegedy","year":"2015","journal-title":"Proc IEEE Conf Comput Vis and Pattern Recognit"},{"key":"ref232","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2577031"},{"key":"ref70","article-title":"Very deep convolutional networks for large-scale image recognition","author":"simonyan","year":"2014","journal-title":"arXiv 1409 1556"},{"key":"ref112","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2019.09.107"},{"key":"ref233","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3040485"},{"key":"ref73","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-020-05695-y"},{"key":"ref230","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00308"},{"key":"ref72","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.243"},{"key":"ref110","article-title":"Squeezenet: AlexNet-level accuracy with 50x fewer parameters and < 1 MB model size","author":"iandola","year":"2016","journal-title":"arXiv 1602 07360"},{"key":"ref231","first-page":"8032","article-title":"A deep learning-based surface defect inspection system using multiscale and channel-compressed features","volume":"69","author":"yang","year":"2020","journal-title":"IEEE Trans Instrum Meas"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1145\/3065386"},{"key":"ref119","doi-asserted-by":"publisher","DOI":"10.3390\/app9245449"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-01234-2_1"},{"key":"ref117","doi-asserted-by":"publisher","DOI":"10.1016\/j.mfglet.2022.10.001"},{"key":"ref238","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3059860"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298594"},{"key":"ref118","doi-asserted-by":"publisher","DOI":"10.3390\/app10030933"},{"key":"ref239","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3128208"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1007\/s10994-019-05855-6"},{"key":"ref115","doi-asserted-by":"publisher","DOI":"10.1109\/SYNASC.2017.00049"},{"key":"ref236","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2977366"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1007\/s10921-021-00823-4"},{"key":"ref116","doi-asserted-by":"publisher","DOI":"10.3390\/s20123336"},{"key":"ref237","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2009.191"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3159293"},{"key":"ref113","doi-asserted-by":"publisher","DOI":"10.3390\/app12136455"},{"key":"ref234","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3092510"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2020.03.009"},{"key":"ref114","doi-asserted-by":"publisher","DOI":"10.1007\/s40009-022-01131-9"},{"key":"ref235","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-023-11087-9"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1186\/s40537-018-0151-6"},{"key":"ref122","doi-asserted-by":"publisher","DOI":"10.32604\/iasc.2023.027659"},{"key":"ref243","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3136183"},{"key":"ref123","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3032190"},{"key":"ref244","doi-asserted-by":"publisher","DOI":"10.3390\/s20061562"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3237844"},{"key":"ref120","doi-asserted-by":"publisher","DOI":"10.3390\/met11040549"},{"key":"ref241","doi-asserted-by":"publisher","DOI":"10.3390\/sym13091731"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1007\/s10462-023-10438-y"},{"key":"ref121","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmapro.2020.05.033"},{"key":"ref242","doi-asserted-by":"publisher","DOI":"10.3390\/app12168070"},{"key":"ref240","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2022.107294"},{"key":"ref168","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2021.107045"},{"key":"ref289","doi-asserted-by":"publisher","DOI":"10.1002\/mp.15799"},{"key":"ref169","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3047221"},{"key":"ref290","doi-asserted-by":"publisher","DOI":"10.5220\/0010142902690276"},{"key":"ref170","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3094452"},{"key":"ref291","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2021.106816"},{"key":"ref177","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3162286"},{"key":"ref298","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2018.2884462"},{"key":"ref178","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3003588"},{"key":"ref299","article-title":"A survey of model compression and acceleration for deep neural networks","author":"cheng","year":"2020","journal-title":"arXiv 1710 09282"},{"key":"ref175","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.244"},{"key":"ref296","first-page":"3366","article-title":"A continual learning survey: Defying forgetting in classification tasks","volume":"44","author":"lange","year":"2019","journal-title":"IEEE Trans Pattern Anal Mach Intell"},{"key":"ref176","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-021-08399-z"},{"key":"ref297","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-020-17866-2"},{"key":"ref173","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-020-04819-5"},{"key":"ref294","doi-asserted-by":"publisher","DOI":"10.1109\/INDIN45523.2021.9557417"},{"key":"ref174","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2021.108396"},{"key":"ref295","article-title":"A continual learning framework for adaptive defect classification and inspection","author":"sun","year":"2022","journal-title":"arXiv 2203 08796"},{"key":"ref171","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3168895"},{"key":"ref292","first-page":"1","article-title":"Transfusion: Understanding transfer learning for medical imaging","author":"raghu","year":"2019","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref172","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2977821"},{"key":"ref293","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP49357.2023.10095744"},{"key":"ref179","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2021.107272"},{"key":"ref180","article-title":"Mixed supervision for surface-defect detection: From weakly to fully supervised learning","volume":"129","author":"bo\u017ei?","year":"2021","journal-title":"Comput Ind"},{"key":"ref181","doi-asserted-by":"publisher","DOI":"10.1016\/j.image.2022.116807"},{"key":"ref188","doi-asserted-by":"publisher","DOI":"10.1155\/2022\/2549683"},{"key":"ref189","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3196935"},{"key":"ref186","doi-asserted-by":"publisher","DOI":"10.3390\/app12042175"},{"key":"ref187","first-page":"7022","article-title":"Detail-semantic guide network based on spatial attention for surface defect detection with fewer samples","volume":"53","author":"meng","year":"2022","journal-title":"Int J Speech Technol"},{"key":"ref184","doi-asserted-by":"publisher","DOI":"10.3390\/app12094645"},{"key":"ref185","doi-asserted-by":"publisher","DOI":"10.1007\/s40194-022-01257-w"},{"key":"ref182","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.112614"},{"key":"ref183","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3251988"},{"key":"ref148","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3144224"},{"key":"ref269","doi-asserted-by":"publisher","DOI":"10.1155\/2022\/6174255"},{"key":"ref149","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2022.118788"},{"key":"ref146","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-022-07474-0"},{"key":"ref267","doi-asserted-by":"publisher","DOI":"10.3390\/s22093467"},{"key":"ref147","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2958826"},{"key":"ref268","doi-asserted-by":"crossref","first-page":"981","DOI":"10.53106\/160792642022092305006","article-title":"Development of an intelligent defect detection system for gummy candy under edge computing","volume":"23","author":"liu","year":"2022","journal-title":"J Internet Technol"},{"key":"ref155","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2020.3031188"},{"key":"ref276","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2915404"},{"key":"ref156","doi-asserted-by":"publisher","DOI":"10.1109\/ICAPAI49758.2021.9462060"},{"key":"ref277","doi-asserted-by":"publisher","DOI":"10.1109\/ICICIP47338.2019.9012199"},{"key":"ref153","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-021-01776-1"},{"key":"ref274","first-page":"1","article-title":"Automated defect recognition of castings defects using neural networks","volume":"41","author":"p\u00e9rez","year":"2022","journal-title":"J Nondestruct Eval"},{"key":"ref154","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2913620"},{"key":"ref275","doi-asserted-by":"publisher","DOI":"10.3390\/s21217264"},{"key":"ref151","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-019-01476-x"},{"key":"ref272","doi-asserted-by":"publisher","DOI":"10.3390\/app12052412"},{"key":"ref152","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2021.101471"},{"key":"ref273","doi-asserted-by":"publisher","DOI":"10.3390\/s23010544"},{"key":"ref270","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111665"},{"key":"ref150","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-022-13568-7"},{"key":"ref271","doi-asserted-by":"publisher","DOI":"10.1007\/s10489-022-03595-0"},{"key":"ref159","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3127188"},{"key":"ref157","doi-asserted-by":"publisher","DOI":"10.3390\/app8091575"},{"key":"ref278","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-019-01484-x"},{"key":"ref158","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2022.103834"},{"key":"ref279","doi-asserted-by":"publisher","DOI":"10.3906\/elk-1903-112"},{"key":"ref280","doi-asserted-by":"publisher","DOI":"10.3390\/s20061650"},{"key":"ref166","doi-asserted-by":"publisher","DOI":"10.3389\/fbioe.2021.810876"},{"key":"ref287","first-page":"3921","article-title":"Adaptive sample selection for robust learning under label noise","author":"patel","year":"2021","journal-title":"Proc IEEE\/CVF Winter Conf Appl Comput Vis (WACV)"},{"key":"ref167","doi-asserted-by":"publisher","DOI":"10.3390\/app10186215"},{"key":"ref288","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3203198"},{"key":"ref164","doi-asserted-by":"crossref","DOI":"10.1016\/j.eswa.2022.118269","article-title":"Swin-MFINet: Swin transformer based multi-feature integration network for detection of pixel-level surface defects","volume":"209","author":"\u00fczen","year":"2022","journal-title":"Exp Syst Appl"},{"key":"ref285","doi-asserted-by":"publisher","DOI":"10.1145\/3269206.3271672"},{"key":"ref165","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3127645"},{"key":"ref286","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2022.3152527"},{"key":"ref162","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3033726"},{"key":"ref283","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2022.103689"},{"key":"ref163","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2018.2886031"},{"key":"ref284","doi-asserted-by":"publisher","DOI":"10.32604\/csse.2022.020020"},{"key":"ref160","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3151926"},{"key":"ref281","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3246499"},{"key":"ref161","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-022-02068-y"},{"key":"ref282","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2020.107571"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2020.9200875"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/iCAST51195.2020.9319407"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3034731"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2017.10.020"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s11554-020-01023-5"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2962437"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/3236386.3241340"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/met11020223"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/app8112195"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2022.3151560"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1080\/03019233.2020.1816806"},{"key":"ref1","article-title":"Image\/video deep anomaly detection: A survey","author":"mohammadi","year":"2021","journal-title":"arXiv 2103 01739"},{"key":"ref191","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2017.8296692"},{"key":"ref192","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3252910"},{"key":"ref190","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1755\/1\/012041"},{"key":"ref199","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3250225"},{"key":"ref197","doi-asserted-by":"publisher","DOI":"10.1109\/COASE.2019.8843204"},{"key":"ref198","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2023.105835"},{"key":"ref195","doi-asserted-by":"publisher","DOI":"10.1155\/2022\/4481495"},{"key":"ref196","doi-asserted-by":"publisher","DOI":"10.1109\/DSA51864.2020.00071"},{"key":"ref193","doi-asserted-by":"publisher","DOI":"10.3390\/s22166226"},{"key":"ref194","doi-asserted-by":"publisher","DOI":"10.3390\/ma14092095"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10005208\/10113226.pdf?arnumber=10113226","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,5,29]],"date-time":"2023-05-29T17:40:53Z","timestamp":1685382053000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10113226\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":321,"URL":"https:\/\/doi.org\/10.1109\/access.2023.3271748","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}