{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,4]],"date-time":"2026-06-04T18:24:18Z","timestamp":1780597458046,"version":"3.54.1"},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"name":"Ministry of Science and Information and Communications Technology (MSIT), South Korea, through the Information Technology Research Center (ITRC) Support Program"},{"DOI":"10.13039\/501100014188","name":"Supervised by the Institute for Information and Communications Technology Planning and Evaluation","doi-asserted-by":"publisher","award":["IITP-2023-RS-2022-00156295"],"award-info":[{"award-number":["IITP-2023-RS-2022-00156295"]}],"id":[{"id":"10.13039\/501100014188","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/access.2023.3285113","type":"journal-article","created":{"date-parts":[[2023,6,9]],"date-time":"2023-06-09T17:26:53Z","timestamp":1686331613000},"page":"58850-58862","source":"Crossref","is-referenced-by-count":2,"title":["AMS Circuit Design Optimization Technique Based on ANN Regression Model With VAE Structure"],"prefix":"10.1109","volume":"11","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7150-0991","authenticated-orcid":false,"given":"Jin-Won","family":"Hyun","sequence":"first","affiliation":[{"name":"Department of Electronic Engineering, Seoul National University of Science and Technology, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0986-4107","authenticated-orcid":false,"given":"Jae-Won","family":"Nam","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Seoul National University of Science and Technology, Seoul, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176568"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3390\/electronics11030408"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2013.6523643"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2006.379831"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ASP-DAC52403.2022.9712575"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1995.523713"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/55.910620"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/3451179"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICCSS.2017.8091468"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/5.899053"},{"key":"ref18","first-page":"117","article-title":"Jitter analysis and a benchmarking figure-of-merit for phase-locked loops","volume":"56","author":"gao","year":"2009","journal-title":"IEEE Trans Circuits Syst II Exp Briefs"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS48785.2022.9937871"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ASP-DAC52403.2022.9712524"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICOIN50884.2021.9333856"},{"key":"ref4","article-title":"Confidential deep learning: Executing proprietary models on untrusted devices","author":"vannostrand","year":"2019","journal-title":"arXiv 1908 10730"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICEIC57457.2023.10049908"},{"key":"ref6","first-page":"860","article-title":"Analog VLSI implementation of support vector machine learning and classification","author":"peng","year":"2008","journal-title":"Proc IEEE Int Symp Circuits Syst"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/SMACD.2019.8795282"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10005208\/10147301.pdf?arnumber=10147301","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,10]],"date-time":"2023-07-10T19:42:06Z","timestamp":1689018126000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10147301\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/access.2023.3285113","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}