{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,20]],"date-time":"2026-03-20T15:30:15Z","timestamp":1774020615626,"version":"3.50.1"},"reference-count":114,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"Article Processing Charges (APC) through the Vellore Institute of Technology, Vellore, India"},{"DOI":"10.13039\/501100001843","name":"Science and Engineering Research Board, Department of Science and Technology (DST), New Delhi, India","doi-asserted-by":"publisher","award":["EMR\/2016\/003906"],"award-info":[{"award-number":["EMR\/2016\/003906"]}],"id":[{"id":"10.13039\/501100001843","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/access.2023.3285722","type":"journal-article","created":{"date-parts":[[2023,6,13]],"date-time":"2023-06-13T17:20:19Z","timestamp":1686676819000},"page":"60866-60888","source":"Crossref","is-referenced-by-count":30,"title":["A Survey on Fault Tolerant and Diagnostic Techniques of Multilevel Inverter"],"prefix":"10.1109","volume":"11","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9375-8886","authenticated-orcid":false,"given":"Shivam Prakash","family":"Gautam","sequence":"first","affiliation":[{"name":"Technology Information, Forecasting and Assessment Council (TIFAC), Vellore Institute of Technology, Vellore, Tamil Nadu, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2592-9815","authenticated-orcid":false,"given":"Manik","family":"Jalhotra","sequence":"additional","affiliation":[{"name":"Caterpillar India Pvt. Ltd., Bengaluru, Karnataka, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lalit Kumar","family":"Sahu","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, National Institute of Technology, Raipur, Chhattisgarh, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9466-4339","authenticated-orcid":false,"given":"Mano Ranjan","family":"Kumar","sequence":"additional","affiliation":[{"name":"School of Electronics Engineering, Kalinga Institute of Technology, Bhubaneswar, Odisha, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9569-2385","authenticated-orcid":false,"given":"Krishna Kumar","family":"Gupta","sequence":"additional","affiliation":[{"name":"Department of Electrical and Instrumentation Engineering, Thapar Institute of Engineering and Technology, Patiala, Punjab, India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2012.06.082"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2682009"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2759760"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2665630"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2015.0176"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2009.2038217"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.917072"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2697844"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2016.0787"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2012.0543"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2626368"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2792146"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2015.1025"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2017.0683"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2341565"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2012.6523240"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2017.2687126"},{"key":"ref43","author":"chong","year":"2013","journal-title":"An Introduction to Optimization"},{"key":"ref49","doi-asserted-by":"crossref","first-page":"7880","DOI":"10.1109\/TPEL.2017.2773611","article-title":"Reconfigurable multilevel inverter with fault-tolerant ability","volume":"33","author":"hossein","year":"2018","journal-title":"IEEE Trans Power Electron"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2581761"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2582834"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2569611"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2386299"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2748032"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2733474"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2774724"},{"key":"ref100","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2702748"},{"key":"ref101","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301712"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2151818"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2016.0574"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2464803"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2628721"},{"key":"ref36","doi-asserted-by":"crossref","first-page":"7569","DOI":"10.1109\/TIE.2015.2455523","article-title":"A fault-tolerant single-phase five-level inverter for grid-independent PV systems","volume":"62","author":"rao a","year":"2015","journal-title":"IEEE Trans Ind Electron"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2325891"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2013.2269531"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2143430"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2510224"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.24295\/CPSSTPEA.2018.00005"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2683534"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2364555"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2558139"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2807404"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2547917"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/63.21879"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2364152"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2240639"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2316228"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2751547"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2008.925160"},{"key":"ref13","year":"1991","journal-title":"Reliability Prediction of Electronic Equipment"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2304561"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2535111"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2192503"},{"key":"ref97","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2007.908176"},{"key":"ref96","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2516968"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2032194"},{"key":"ref99","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2008.2006055"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2624722"},{"key":"ref98","first-page":"628","article-title":"5 kW multilevel DC–DC converter for hybrid electric and fuel cell automotive applications","author":"khan","year":"2007","journal-title":"Proc IEEE Ind Appl Annu Meeting (IAS)"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2402645"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2018.2823320"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2161062"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2751508"},{"key":"ref93","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2017.2670921"},{"key":"ref92","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2336608"},{"key":"ref95","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2628762"},{"key":"ref94","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2359005"},{"key":"ref91","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2454534"},{"key":"ref90","first-page":"4846","volume":"64","year":"1991","journal-title":"Military Handbook (MIL-HDBK-217F)"},{"key":"ref89","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2242093"},{"key":"ref86","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2462717"},{"key":"ref85","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2679439"},{"key":"ref88","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2014.0513"},{"key":"ref87","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2526684"},{"key":"ref82","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2309937"},{"key":"ref81","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2472356"},{"key":"ref84","doi-asserted-by":"publisher","DOI":"10.1109\/PES.2011.6038903"},{"key":"ref83","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2811904"},{"key":"ref80","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2618773"},{"key":"ref79","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2047407"},{"key":"ref108","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2477849"},{"key":"ref78","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2514979"},{"key":"ref109","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2613983"},{"key":"ref106","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2472358"},{"key":"ref107","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2014.0943"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2520884"},{"key":"ref104","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2434995"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2621411"},{"key":"ref105","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2793182"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2016.0033"},{"key":"ref102","doi-asserted-by":"publisher","DOI":"10.1109\/28.567113"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2015.2460334"},{"key":"ref103","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2354396"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2918049"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2373390"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2016.0878"},{"key":"ref111","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2328713"},{"key":"ref70","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2509446"},{"key":"ref112","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2014.7049189"},{"key":"ref73","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2624147"},{"key":"ref72","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2017.0085"},{"key":"ref110","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2017.2693563"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2632058"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2377152"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2444661"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2005.851645"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2407884"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2019771"},{"key":"ref113","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2465359"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2002.803172"},{"key":"ref114","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2624723"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2143378"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2222856"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2360706"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10005208\/10149337.pdf?arnumber=10149337","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,10]],"date-time":"2023-07-10T19:33:20Z","timestamp":1689017600000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10149337\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":114,"URL":"https:\/\/doi.org\/10.1109\/access.2023.3285722","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}