{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,25]],"date-time":"2026-03-25T16:11:01Z","timestamp":1774455061391,"version":"3.50.1"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"This publication, was made possible by the National Priorities Research Program","award":["13S-0108-200028"],"award-info":[{"award-number":["13S-0108-200028"]}]},{"DOI":"10.13039\/100008982","name":"Qatar National Research Fund","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100008982","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100019779","name":"Qatar National Library","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100019779","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/access.2023.3297496","type":"journal-article","created":{"date-parts":[[2023,7,20]],"date-time":"2023-07-20T17:56:11Z","timestamp":1689875771000},"page":"74722-74735","source":"Crossref","is-referenced-by-count":25,"title":["Reduced Voltage Stress and Spikes in Source Current of 7-Level Switched-Capacitor Based Multilevel Inverter"],"prefix":"10.1109","volume":"11","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1689-8279","authenticated-orcid":false,"given":"Shirazul","family":"Islam","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Qatar University, Doha, Qatar"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0799-500X","authenticated-orcid":false,"given":"Marif","family":"Daula Siddique","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, National University of Singapore (NUS), Queenstown, Singapore"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3245-9495","authenticated-orcid":false,"given":"Md. Reyaz","family":"Hussan","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Aligarh Muslim University, Aligarh, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6932-4367","authenticated-orcid":false,"given":"Atif","family":"Iqbal","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Qatar University, Doha, Qatar"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2015.2513204"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2018.2890649"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2020.3011908"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2023.3276354"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2021.3071375"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2010.2043039"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2015.2405012"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2023.3258425"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ojpel.2022.3209540"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2017.2710265"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2018.2805685"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2017.2750626"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2017.2742525"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2018.2848675"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tec.2022.3222498"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2018.2879890"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2019.2955318"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2019.2896606"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2020.3043126"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.17775\/cseejpes.2020.02620"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2019.2946860"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2022.3172146"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2019.2891248"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2021.3078903"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2021.3088443"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2021.3067347"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2020.2973666"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2016.2557317"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2021.3077604"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2017.2761127"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/tec.2014.2372095"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/tsg.2017.2697686"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2016.2533620"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2014.2308357"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10005208\/10188683.pdf?arnumber=10188683","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,14]],"date-time":"2024-03-14T02:12:15Z","timestamp":1710382335000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10188683\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/access.2023.3297496","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}