{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,18]],"date-time":"2026-08-18T00:11:10Z","timestamp":1787011870660,"version":"build-2736575974"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/100006133","name":"The Advanced Research Projects Agency-Energy","doi-asserted-by":"crossref","award":["DE-AR0001110"],"award-info":[{"award-number":["DE-AR0001110"]}],"id":[{"id":"10.13039\/100006133","id-type":"DOI","asserted-by":"crossref"}]},{"name":"Deputyship for Research and Innovation, \u201cMinistry of Education\u201d in Saudi Arabia for funding this research","award":["IFKSUOR3-262-2"],"award-info":[{"award-number":["IFKSUOR3-262-2"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/access.2023.3298874","type":"journal-article","created":{"date-parts":[[2023,7,25]],"date-time":"2023-07-25T13:38:13Z","timestamp":1690292293000},"page":"81134-81142","source":"Crossref","is-referenced-by-count":7,"title":["T-Type Modular DC Circuit Breaker (T-Breaker) as a Compensator for Future DC Grids"],"prefix":"10.1109","volume":"11","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4378-5111","authenticated-orcid":false,"given":"Faisal","family":"Alsaif","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, College of Engineering, King Saud University, Riyadh, Saudi Arabia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yue","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, College of Engineering, The Ohio State University, Columbus, OH, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0222-074X","authenticated-orcid":false,"given":"Xiao","family":"Li","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, College of Engineering, The Ohio State University, Columbus, OH, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9747-8083","authenticated-orcid":false,"given":"Nihanth","family":"Adina","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, College of Engineering, The Ohio State University, Columbus, OH, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Khalid","family":"Alkhalid","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, College of Engineering, King Saud University, Riyadh, Saudi Arabia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6199-7738","authenticated-orcid":false,"given":"Jin","family":"Wang","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, College of Engineering, The Ohio State University, Columbus, OH, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2928814"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2016.2618382"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2019.2959535"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2941714"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/APEC43599.2022.9773555"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2015.2457909"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2910527"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/9781119515661.ch5"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2012.2191250"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/EPEPEMC.2008.4635483"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICDCM.2015.7152068"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2542278"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3057130"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/WiPDA49284.2021.9645140"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/APEC42165.2021.9487198"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2006.877483"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2091285"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2151880"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2014.2305904"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2012.6129649"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2705914"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ESARS-ITEC.2018.8607438"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10005208\/10194414.pdf?arnumber=10194414","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,28]],"date-time":"2023-08-28T14:12:37Z","timestamp":1693231957000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10194414\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/access.2023.3298874","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}