{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,31]],"date-time":"2026-01-31T05:40:48Z","timestamp":1769838048033,"version":"3.49.0"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"name":"Article Processing Charges (APC) through the Vellore Institute of Technology, Vellore, India"},{"DOI":"10.13039\/501100001843","name":"Science and Engineering Research Board, Department of Science and Technology (DST), New Delhi, India","doi-asserted-by":"publisher","award":["EMR\/2016\/003906"],"award-info":[{"award-number":["EMR\/2016\/003906"]}],"id":[{"id":"10.13039\/501100001843","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/access.2023.3312188","type":"journal-article","created":{"date-parts":[[2023,9,8]],"date-time":"2023-09-08T17:35:37Z","timestamp":1694194537000},"page":"97826-97839","source":"Crossref","is-referenced-by-count":3,"title":["Techniques to Reduce Capacitor Voltage Ripples in Multilevel Inverters"],"prefix":"10.1109","volume":"11","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9375-8886","authenticated-orcid":false,"given":"Shivam Prakash","family":"Gautam","sequence":"first","affiliation":[{"name":"Technology Information, Forecasting and Assessment Council (TIFAC), Vellore Institute of Technology, Vellore, Tamil Nadu, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2592-9815","authenticated-orcid":false,"given":"Manik","family":"Jalhotra","sequence":"additional","affiliation":[{"name":"Caterpillar India Private Ltd., Bengaluru, Karnataka, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6932-4367","authenticated-orcid":false,"given":"Atif","family":"Iqbal","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Qatar University, Doha, Qatar"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9466-4339","authenticated-orcid":false,"given":"Lalit Kumar","family":"Sahu","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, National Institute of Technology, Raipur, Chhattisgarh, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4718-3313","authenticated-orcid":false,"given":"Mano Ranjan","family":"Kumar","sequence":"additional","affiliation":[{"name":"School of Electronics Engineering, Kalinga Institute of Technology, Bhubaneswar, Odisha, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8654-7143","authenticated-orcid":false,"given":"Meena","family":"Malik","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Engineering, Chandigarh University, Mohali, Punjab, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9739-5456","authenticated-orcid":false,"given":"Shima","family":"Sadaf","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, College of Engineering, King Faisal University, Al Ahsa, Saudi Arabia"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2018.2869830"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2772200"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2745453"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2688962"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2017.2748582"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2405059"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/OJIES.2022.3221015"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3227398"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2654490"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2514344"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2891937"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2898105"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2792146"},{"key":"ref23","doi-asserted-by":"crossref","first-page":"7569","DOI":"10.1109\/TIE.2015.2455523","article-title":"A fault-tolerant single-phase five-level inverter for grid-independent PV systems","volume":"62","author":"rao a","year":"2015","journal-title":"IEEE Trans Ind Electron"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2017.0683"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2936271"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2930900"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2934080"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2935612"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.917072"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2018.5452"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2626368"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3114745"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3135623"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2022.3205882"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3196659"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2022.3181217"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3149531"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2925125"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10005208\/10246156.pdf?arnumber=10246156","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,15]],"date-time":"2023-09-15T17:45:26Z","timestamp":1694799926000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10246156\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/access.2023.3312188","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}