{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,31]],"date-time":"2026-01-31T10:30:55Z","timestamp":1769855455130,"version":"3.49.0"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100003836","name":"Electronic Design Automation (EDA) Tool Program of the IC Design Education Center (IDEC), Republic of Korea","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003836","id-type":"DOI","asserted-by":"publisher"}]},{"name":"\u201cLeaders in INdustry-university Cooperation 3.0\u201d"},{"DOI":"10.13039\/501100003725","name":"Ministry of Education and the National Research Foundation of Korea","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/access.2023.3312926","type":"journal-article","created":{"date-parts":[[2023,9,7]],"date-time":"2023-09-07T17:37:15Z","timestamp":1694108235000},"page":"97456-97465","source":"Crossref","is-referenced-by-count":7,"title":["Investigation Into the Degradation of DDR4 DRAM Owing to Total Ionizing Dose Effects"],"prefix":"10.1109","volume":"11","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9926-0125","authenticated-orcid":false,"given":"Gyeongyeop","family":"Lee","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-9256-4627","authenticated-orcid":false,"given":"Minki","family":"Suh","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-5117-210X","authenticated-orcid":false,"given":"Minsang","family":"Ryu","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6741-6383","authenticated-orcid":false,"given":"Yunjong","family":"Lee","sequence":"additional","affiliation":[{"name":"Advanced Radiation Technology Institute, Korea Atomic Energy Research Institute, Jeongeup, Republic of Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5118-1310","authenticated-orcid":false,"given":"Jin-Woo","family":"Han","sequence":"additional","affiliation":[{"name":"Center for Nanotechnology, NASA Ames Research Center, Moffett Field, CA, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7798-3381","authenticated-orcid":false,"given":"Jungsik","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Gyeongsang National University (GNU), Jinju, Republic of Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2021.3068186"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/imw.2015.7150307"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2020.2963911"},{"key":"ref4","volume-title":"DDR4 SDRAM Specification, document JESD79-4C","year":"2020"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/irps.2017.7936404"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2016.2551733"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2022.3149487"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2019.2956293"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/redw.2013.6658199"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/radecs.2013.6937399"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/radecs45761.2018.9328655"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/irps.2018.8353690"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2015.2414426"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2017.2786140"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1063\/5.0105173"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/23.903763"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1103\/physrevlett.87.165506"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2008.2001040"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2011.2171364"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2019.2909720"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2005.857185"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/led.2020.3046914"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/led.2020.3037640"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2002.805387"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1063\/1.2210293"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2018.2828142"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2008.2006478"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2018.2879383"},{"key":"ref29","volume-title":"Magnettech ESR5000","year":"2023"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2014.2365532"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/23.25493"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/radecs.2016.8093103"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/23.45373"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2021.3066140"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10005208\/10243015.pdf?arnumber=10243015","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,13]],"date-time":"2024-03-13T22:50:29Z","timestamp":1710370229000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10243015\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/access.2023.3312926","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}