{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,17]],"date-time":"2026-05-17T06:50:50Z","timestamp":1779000650984,"version":"3.51.4"},"reference-count":44,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/access.2023.3328534","type":"journal-article","created":{"date-parts":[[2023,10,30]],"date-time":"2023-10-30T19:22:45Z","timestamp":1698693765000},"page":"121231-121245","source":"Crossref","is-referenced-by-count":9,"title":["Low-Artifact and Fast Backlit Image Enhancement Method Based on Suppression of Lightness Order Error"],"prefix":"10.1109","volume":"11","author":[{"given":"Masato","family":"Akai","sequence":"first","affiliation":[{"name":"Imaging Solution Development Department, Nikon Corporation, Minato-ku, Tokyo, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4851-2964","authenticated-orcid":false,"given":"Yoshiaki","family":"Ueda","sequence":"additional","affiliation":[{"name":"Faculty of Advanced Science and Technology, Ryukoku University, Otsu-shi, Shiga, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Takanori","family":"Koga","sequence":"additional","affiliation":[{"name":"Faculty of Humanity-Oriented Science and Engineering, Kindai University, Iizuka-shi, Fukuoka, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3673-9539","authenticated-orcid":false,"given":"Noriaki","family":"Suetake","sequence":"additional","affiliation":[{"name":"Graduate School of Science and Technology for Innovation, Yamaguchi University, Yamaguchi-shi, Yamaguchi, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/iet-ipr.2019.0814"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2022.3140610"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2016.05.031"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.image.2022.116742"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2010.2092441"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.1979.4310076"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCOM.1983.1095851"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2022.109249"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2019.2910412"},{"key":"ref30","first-page":"1","article-title":"Deep retinex decomposition for low-light enhancement","author":"wei","year":"2018","journal-title":"Proc Brit Mach Vis Conf"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2016.7533126"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.00194"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-019-7384-z"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/3503161.3548006"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2018.2810539"},{"key":"ref1","first-page":"336","article-title":"Exposure correction for imaging devices: An overview","author":"battiato","year":"2009","journal-title":"Single-Sensor Imaging Methods and Applications for Digital Cameras"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MMSP.2015.7340808"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.2352\/ISSN.2470-1173.2019.14.COLOR-088"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/PG.2007.17"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2012.213"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2987256"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.2352\/ISSN.2169-2629.2018.26.32"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.00185"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/3343031.3351069"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2021.3126387"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2020.3042973"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.2352\/ISSN.2470-1173.2016.13.IQSP-012"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/ICCVW.2017.356"},{"key":"ref41","author":"li","year":"2023","journal-title":"Li’s Database"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.cviu.2022.103403"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2017.2649101"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2017.2771142"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1117\/12.477589"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3216880"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2023.3239511"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2016.06.008"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2013.2261309"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/83.597272"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2016.2639450"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2020.3036312"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.image.2021.116527"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/83.557356"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/B978-0-12-336156-1.50061-6"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1023\/B:VISI.0000013087.49260.fb"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10005208\/10299637.pdf?arnumber=10299637","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,12,11]],"date-time":"2023-12-11T20:38:35Z","timestamp":1702327115000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10299637\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":44,"URL":"https:\/\/doi.org\/10.1109\/access.2023.3328534","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}