{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,21]],"date-time":"2026-04-21T14:57:18Z","timestamp":1776783438449,"version":"3.51.2"},"reference-count":11,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100020884","name":"Conicyt Fondef\/Cuarto Concurso IDeA en Dos Etapas del Fondo de Fomento al Desarrollo Cient\u00edfico y Tecnol\u00f3gico, 2017 Fondef\/Conicyt","doi-asserted-by":"publisher","award":["ID17I20421"],"award-info":[{"award-number":["ID17I20421"]}],"id":[{"id":"10.13039\/501100020884","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100018735","name":"Fondap Solar Energy Research Center","doi-asserted-by":"publisher","award":["15110019"],"award-info":[{"award-number":["15110019"]}],"id":[{"id":"10.13039\/501100018735","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100005916","name":"Universidad de La Frontera, Diufro","doi-asserted-by":"publisher","award":["PP23-0044"],"award-info":[{"award-number":["PP23-0044"]}],"id":[{"id":"10.13039\/501100005916","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/access.2023.3335001","type":"journal-article","created":{"date-parts":[[2023,11,20]],"date-time":"2023-11-20T14:29:10Z","timestamp":1700490550000},"page":"130931-130941","source":"Crossref","is-referenced-by-count":5,"title":["Humidity and Harmonic Current Considerations for Indices to Estimate Contamination Levels on HV Insulators"],"prefix":"10.1109","volume":"11","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7155-7488","authenticated-orcid":false,"given":"Rodrigo J.","family":"Villalobos","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Universidad de La Frontera, Temuco, Chile"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6364-723X","authenticated-orcid":false,"given":"Luis A.","family":"Moran","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Universidad de Concepción, Concepción, Chile"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-6365-553X","authenticated-orcid":false,"given":"Mauricio","family":"Inostroza","sequence":"additional","affiliation":[{"name":"Carrera de Ingeniería Civil Eléctrica, Facultad de Ingeniería y Ciencias, Universidad de La Frontera, Temuco, Chile"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4614-2843","authenticated-orcid":false,"given":"Alvaro","family":"Hoffer","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Universidad de La Frontera, Temuco, Chile"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1864-9401","authenticated-orcid":false,"given":"G. Cristian","family":"Pesce","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Universidad de La Frontera, Temuco, Chile"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8145-0251","authenticated-orcid":false,"given":"Fernando","family":"Huenup\u00e1n","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Universidad de La Frontera, Temuco, Chile"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/access.2022.3175515"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2020.3005223"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrd.2020.2968556"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2019.2934008"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/access.2022.3191349"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/access.2022.3148709"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/access.2020.3026136"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/access.2020.2993630"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/access.2021.3057626"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2017.2733490"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3209729"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10005208\/10323322.pdf?arnumber=10323322","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T18:05:40Z","timestamp":1761588340000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10323322\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/access.2023.3335001","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}