{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,30]],"date-time":"2025-12-30T08:44:03Z","timestamp":1767084243414,"version":"3.37.3"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100003977","name":"Israel Science Foundation","doi-asserted-by":"publisher","award":["2511\/20"],"award-info":[{"award-number":["2511\/20"]}],"id":[{"id":"10.13039\/501100003977","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003977","name":"Israel Science Foundation","doi-asserted-by":"publisher","award":["1266\/20"],"award-info":[{"award-number":["1266\/20"]}],"id":[{"id":"10.13039\/501100003977","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/access.2023.3338001","type":"journal-article","created":{"date-parts":[[2023,11,30]],"date-time":"2023-11-30T19:17:33Z","timestamp":1701371853000},"page":"136269-136278","source":"Crossref","is-referenced-by-count":2,"title":["Silicon Proven 1.29 \u03bcm \u00d7 1.8 \u03bcm 65nm Sub-Vt Optical Sensor for Hardware Security Applications"],"prefix":"10.1109","volume":"11","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3136-8935","authenticated-orcid":false,"given":"David","family":"Zooker","sequence":"first","affiliation":[{"name":"Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yoav","family":"Weizman","sequence":"additional","affiliation":[{"name":"Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4994-1536","authenticated-orcid":false,"given":"Alexander","family":"Fish","sequence":"additional","affiliation":[{"name":"Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3101-9551","authenticated-orcid":false,"given":"Osnat","family":"Keren","sequence":"additional","affiliation":[{"name":"Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1007\/3-540-69053-0_4"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/ACCESS.2022.3217212"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/JPROC.2012.2188769"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1007\/978-3-030-64448-2_17"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/TVLSI.2012.2231707"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1007\/3-540-36400-5_2"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/FDTC.2011.12"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.3390\/electronics11132023"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/HST.2013.6581576"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1007\/11506447_4"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/TDMR.2016.2531506"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1017\/S1431927622000642"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.3390\/s40500058"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/DTIS.2014.6850664"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/FDTC.2019.00014"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/EWDTS50664.2020.9225092"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1109\/ECTC.2018.00081"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/A-SSCC47793.2019.9056950"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1109\/TED.2021.3058226"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/TVLSI.2021.3073946"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1007\/s13389-020-00224-9"},{"key":"ref22","first-page":"1","article-title":"Robust error detection in communication and computational channels","volume-title":"Proc. Spectral Methods Multirate Signal Process. SMMSP Int. Workshop","author":"Karpovsky"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1109\/tdsc.2018.2816638"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1007\/978-3-540-78967-3_27"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1109\/TC.2013.146"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1109\/HST.2015.7140242"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1145\/3178432"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1109\/JSSC.2018.2869142"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.7567\/1347-4065\/ab65d3"},{"doi-asserted-by":"publisher","key":"ref30","DOI":"10.46586\/tches.v2018.i3.547-572"},{"doi-asserted-by":"publisher","key":"ref31","DOI":"10.1016\/j.mejo.2019.05.017"},{"doi-asserted-by":"publisher","key":"ref32","DOI":"10.1007\/978-3-030-42921-8_20"},{"doi-asserted-by":"publisher","key":"ref33","DOI":"10.1109\/jssc.2023.3305188"},{"doi-asserted-by":"publisher","key":"ref34","DOI":"10.1109\/jssc.2023.3274596"},{"doi-asserted-by":"publisher","key":"ref35","DOI":"10.1109\/IOLTS.2014.6873669"},{"doi-asserted-by":"publisher","key":"ref36","DOI":"10.1109\/FDTC.2016.14"},{"doi-asserted-by":"publisher","key":"ref37","DOI":"10.1007\/978-3-319-49445-6_2"},{"doi-asserted-by":"publisher","key":"ref38","DOI":"10.1109\/NTMS.2019.8763825"},{"volume-title":"Test Report PDM HPP","year":"2020","key":"ref39"},{"doi-asserted-by":"publisher","key":"ref40","DOI":"10.1109\/FDTC.2011.18"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10005208\/10335669.pdf?arnumber=10335669","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,12,19]],"date-time":"2023-12-19T22:41:39Z","timestamp":1703025699000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10335669\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":40,"URL":"https:\/\/doi.org\/10.1109\/access.2023.3338001","relation":{},"ISSN":["2169-3536"],"issn-type":[{"type":"electronic","value":"2169-3536"}],"subject":[],"published":{"date-parts":[[2023]]}}}