{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,4]],"date-time":"2026-07-04T16:54:15Z","timestamp":1783184055690,"version":"3.54.6"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U22B6008"],"award-info":[{"award-number":["U22B6008"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["12075091"],"award-info":[{"award-number":["12075091"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/access.2023.3340706","type":"journal-article","created":{"date-parts":[[2023,12,7]],"date-time":"2023-12-07T19:40:53Z","timestamp":1701978053000},"page":"137485-137494","source":"Crossref","is-referenced-by-count":7,"title":["Transient Stability Analysis and Enhancement of PLL-VSC Considering State-Dependent Damping"],"prefix":"10.1109","volume":"11","author":[{"ORCID":"https:\/\/orcid.org\/0009-0004-1544-7398","authenticated-orcid":false,"given":"Dengke","family":"Xu","sequence":"first","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2331-2002","authenticated-orcid":false,"given":"Meng","family":"Zhan","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2019.2925703"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.2965721"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2959085"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2019.8912571"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2022.108683"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2018.2827402"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.24295\/CPSSTPEA.2020.00025"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3047480"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2020.3037155"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2013.2295261"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.23919\/IPEC.2018.8507447"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3000516"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3137806"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3164687"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2021.3089025"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2022.108135"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3389\/fenrg.2020.00056"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/OJIA.2020.3020392"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/5.0136975"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rpg.2020.0204"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2019.2892224"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2022.108062"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2764856"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2345880"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.1985.1104057"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2022.108520"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CAC48633.2019.8996210"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2020.3033468"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2954555"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/MPER.2002.994846"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.3390\/en16062923"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10005208\/10348566.pdf?arnumber=10348566","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T01:43:47Z","timestamp":1705023827000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10348566\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/access.2023.3340706","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}