{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,21]],"date-time":"2026-07-21T14:25:26Z","timestamp":1784643926335,"version":"3.55.0"},"reference-count":46,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62103256"],"award-info":[{"award-number":["62103256"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/access.2023.3343566","type":"journal-article","created":{"date-parts":[[2023,12,15]],"date-time":"2023-12-15T19:45:07Z","timestamp":1702669507000},"page":"141764-141775","source":"Crossref","is-referenced-by-count":8,"title":["PDDD-Net: Defect Detection Network Based on Parallel Attention Mechanism and Dual-Channel Spatial Pyramid Pooling"],"prefix":"10.1109","volume":"11","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3230-7181","authenticated-orcid":false,"given":"Tingting","family":"Sui","sequence":"first","affiliation":[{"name":"School of Electronic Information Engineering, Shanghai Dianji University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-5804-5952","authenticated-orcid":false,"given":"Junwen","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electronic Information Engineering, Shanghai Dianji University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1061\/JTEPBS.0000678"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1142\/S0217984922500816"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-017-0882-0"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s42835-022-01346-2"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.18494\/SAM.2021.3220"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/jmse9040364"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1575\/1\/012103"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1002\/pip.3191"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.17265\/2328-2150\/2020.01.005"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2021.115673"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1437\/1\/012004"},{"issue":"10","key":"ref12","doi-asserted-by":"crossref","first-page":"1561","DOI":"10.3390\/electronics11101561","article-title":"Research on vehicle parts defect detection based on deep learning","volume":"11","author":"Liu","year":"2022","journal-title":"Electronics"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s12559-022-10061-z"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICPCSN58827.2023.00012"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2020.06.035"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3233\/XST-211120"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CIS54983.2021.00035"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/DDCLS58216.2023.10166190"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICIBA56860.2023.10164856"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.engfailanal.2022.106032"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2018.8451351"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.compscitech.2022.109882"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2712838"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmapro.2019.04.023"},{"issue":"11","key":"ref25","first-page":"121","article-title":"Surface defect recognition of fibreboard based on random forest","volume":"56","author":"Liu","year":"2018","journal-title":"Scientia Silvae Sinicae"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/s42417-022-00725-3"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2021.104401"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2577031"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2572683"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.169"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2021.103551"},{"issue":"2","key":"ref32","doi-asserted-by":"crossref","first-page":"397","DOI":"10.53106\/160792642022032302018","article-title":"Detection method of photovoltaic panel defect based on improved mask R-CNN","volume":"23","author":"Guo","year":"2022","journal-title":"J. Internet Technol."},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.3390\/agriculture12020248"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.91"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1155\/2022\/4260543"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2021.3085139"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.compag.2022.106780"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/IBDAP52511.2021.9552111"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.3390\/su15010681"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/FAIML57028.2022.00051"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ICIEA58696.2023.10241832"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.3390\/s23136052"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3287101"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/NNICE58320.2023.10105750"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1016\/j.jag.2023.103259"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10005208\/10360803.pdf?arnumber=10360803","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T20:46:38Z","timestamp":1705092398000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10360803\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":46,"URL":"https:\/\/doi.org\/10.1109\/access.2023.3343566","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}