{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,4]],"date-time":"2026-08-04T13:59:19Z","timestamp":1785851959955,"version":"3.56.0"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"Shinsung-Sungkyunkwan University (SKKU) Industrial AI Solution Center"},{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea (NRF) Grant funded by the Korean Government through the Ministry of Science and ICT","doi-asserted-by":"publisher","award":["RS-2023-00207903"],"award-info":[{"award-number":["RS-2023-00207903"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Access"],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/access.2024.3349975","type":"journal-article","created":{"date-parts":[[2024,1,4]],"date-time":"2024-01-04T19:58:32Z","timestamp":1704398312000},"page":"5575-5583","source":"Crossref","is-referenced-by-count":14,"title":["Photovoltaic Cell Defect Detection Based on Weakly Supervised Learning With Module-Level Annotations"],"prefix":"10.1109","volume":"12","author":[{"given":"Hyungu","family":"Kang","sequence":"first","affiliation":[{"name":"Department of Industrial Engineering, Sungkyunkwan University, Jangan-gu, Suwon, Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jeongmin","family":"Hong","sequence":"additional","affiliation":[{"name":"Department of Industrial Engineering, Sungkyunkwan University, Jangan-gu, Suwon, Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jiwon","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Industrial Engineering, Sungkyunkwan University, Jangan-gu, Suwon, Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0960-0294","authenticated-orcid":false,"given":"Seokho","family":"Kang","sequence":"additional","affiliation":[{"name":"Department of Industrial Engineering, Sungkyunkwan University, Jangan-gu, Suwon, Republic of Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2019.116319"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.solener.2019.02.067"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOTOV.2019.2920732"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rpg.2019.1342"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/pr9091635"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.solener.2022.06.031"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOTOV.2015.2494692"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.solener.2021.03.058"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2019.8803116"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.solmat.2011.12.007"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2209663"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/YAC51587.2020.9337676"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1093\/nsr\/nwx106"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/3472291"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s10994-019-05855-6"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2017.10.009"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2016.09.002"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2021.106771"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.procs.2019.11.146"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v30i1.10315"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-022-28818-3"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2022.3152527"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-015-0816-y"},{"key":"ref24","article-title":"Very deep convolutional networks for large-scale image recognition","volume-title":"Proc. Int. Conf. Learn. Represent.","author":"Simonyan"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46493-0_38"}],"container-title":["IEEE Access"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6287639\/10380310\/10380555.pdf?arnumber=10380555","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,18]],"date-time":"2024-01-18T01:51:56Z","timestamp":1705542716000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10380555\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/access.2024.3349975","relation":{},"ISSN":["2169-3536"],"issn-type":[{"value":"2169-3536","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024]]}}}